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Physical Principles of Electron Microscopy: An Introduction to TEM ...

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186 Chapter 7<br />

There are now many alternative holographic schemes, the most popular<br />

being <strong>of</strong>f-axis holography (Voelkl et al., 1999). In this method, an electron<br />

biprism is used <strong>to</strong> combine the object wave, representing electrons that pass<br />

through the specimen, with a reference wave formed from electrons that pass<br />

beyond an edge <strong>of</strong> the specimen (Fig. 7-6). The biprism consists <strong>of</strong> a thin<br />

conducting wire (< 1 �m diameter) maintained at a positive potential (up <strong>to</strong> a<br />

few hundred volts), usually inserted at the selected-area-aperture plane <strong>of</strong> a<br />

field-emission <strong>TEM</strong>. The electric field <strong>of</strong> the biprism bends the electron<br />

trajec<strong>to</strong>ries (Fig.7-6) and produces a hologram containing sinusoidal fringes,<br />

running parallel <strong>to</strong> the wire, that are modulated by information about the<br />

specimen; see Fig. 7-7. Highly astigmatic illumination is used <strong>to</strong> maximize<br />

the size <strong>of</strong> the coherence patch where the interfering wavefronts overlap.<br />

W<br />

hologram<br />

specimen<br />

objective<br />

Figure 7-6. Principle <strong>of</strong> <strong>of</strong>f-axis electron holography. <strong>Electron</strong>s that pass through the sample<br />

are combined with those <strong>of</strong> an <strong>of</strong>f-axis beam that is attracted <strong>to</strong>ward a positively biased wire<br />

W, whose axis runs perpendicular <strong>to</strong> the diagram. W is the electron-optical equivalent <strong>of</strong> a<br />

glass biprism, as indicated by the dashed lines.

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