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IJUP08 - Universidade do Porto

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Characterizing the intermetallic formed during ball attach process<br />

Paulo Pereira a,* , Rúben Santos a , Maria M. Barbosa a , Cátia Almeida a<br />

a** Dep. de Engenharia Metalúrgica e de Materiais, Faculdade de Engenharia, <strong>Universidade</strong> <strong>do</strong><br />

<strong>Porto</strong>, Rua Dr. Roberto Frias, 4200-465 <strong>Porto</strong>, Portugal<br />

* pereira.paulo@fe.up.pt<br />

Continuously miniaturization of electronic components requires the most advanced<br />

technologies in which electrical response is a crucial factor to success.<br />

In this study we characterize the interface of an attachment between the copper conductors<br />

of a memory and a solder ball which allows further bonding to printed circuit modules, see<br />

figure 1a). , This connection, made of diferent layers, has a capital importance to ensure a<br />

good electrical and mechanical performance.<br />

The attachment uses a 10 m thick intermediate layer of nickel deposited over a copper<br />

pad and protected by a thin gold film. The solder, with a spherical shape and composition<br />

of Sn-1.0Ag-0.5Cu, is placed on the gold film and the assemblage is heated up to the<br />

brazing temperature.<br />

At the interfacial zone, between the nickel and the solder ball, a continuous layer of an<br />

intermetallic compound of Sn-Ni-Cu is formed. This intermetallic layer has 1 to 2 m<br />

thickness as seen on figure 1b). Some particles of this compound are also observed at inner<br />

zones of the solder ball (see arrow on figure 1b), indicating a preferential copper and nickel<br />

diffusion path inside the ball.<br />

By an AFM analysis it was possible to perform nanoindentation tests, shown on picture<br />

1c). The indentation size variation between Sn braze alloy and intermetallic layer clearly<br />

states the hardness increase at the interface.<br />

Figure 1. a) SEM image of the ball attach bonding; b) SEM image of interface showing the intermetallic<br />

compound formed between the Ni (darker layer) and the Sn braze alloy (lighter area); c) AFM image of the<br />

indentations in the braze alloy and intermetallic compound.<br />

Acknowledgement<br />

The materials characterized in this work were kindly supplied by Qimonda S.A.<br />

** The authors are undergraduate students of the 4th year of Master in Metallurgical and<br />

Materials Engineering.<br />

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