Electromagnetic Testing Chapter 3- Electromagnetic Testing

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With the linear time base form of analysis, no voltage is applied to the vertical deflection plates of the CRT when conditions are balanced; a sinusoidal wave is applied to the vertical deflection plates when an unbalanced condition exists; sawtooth voltages are applied to the horizontal deflection plates. The phase control of the time-based system shifts the signal to the left or right on the CRT screen.With any of the phase analysis methods, storage scopes are useful for examining nonrepetitive flaw indications during high-speed testing. Many state-of-the-art eddy current instruments now offer dual-frequency operation from 1 kHz to 10MHz, storage scope display, absolute or differential detectors, and impedance balancing. Other features include high- or lowfrequency filters for each axis of each impedance plane, 360° rotational control of each axis, instant replay of inspections, printing options, and computer interfacing. Table 3.2 summarizes some of the currently available design features for eddy current instruments. The table and the photographic illustrations that follow clearly show there is a trend toward phase analysis, the incorporation of microprocessors into individual eddy current test instruments, and computer control of large automated lines. Charlie Chong/ Fion Zhang
TABLE 3.2. Comparison of Instrument Design Features Charlie Chong/ Fion Zhang
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Electromagnetic Testing Chapter 3-
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Submarine Applications Charlie Chon
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Fion Zhang at Shanghai 6th April 20
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IVONA TTS Capable. Charlie Chong/ F
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Chapter 3. ELECTROMAGNETIC TESTING
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Barkhausen effect The Barkhausen ef
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Barkhausen Noise Charlie Chong/ Fio
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Figure 3.1 Eddy current principle.
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Figure 3.2 Schematic diagram of bas
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Figure 3.3 The effect of conductivi
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Figure 3.3 The effect of conductivi
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Another important influence on coil
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If the conductivity of the material
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Figure 3.5 The effect of a crack on
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FIGURE 8-49 Conductivity curve: (a)
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So far, we have described how eddy
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Figure 3.6 The effects of (a) condu
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3.1.2 Limiting Frequency f g of Enc
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Figure 3.7 The effect of degree of
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Charlie Chong/ Fion Zhang
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Eddy Current Heating Charlie Chong/
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Eddy Current Heating Charlie Chong/
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Eddy currents weaken the original m
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3.2 MAGNETIC FLUX LEAKAGE THEORY Wh
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3D Magnetic Field Charlie Chong/ Fi
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3D Magnetic Field Fig.1 THE PRINCIP
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Based on what we have learned about
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Charlie Chong/ Fion Zhang Figure 3.
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Magnetic Field - Simple Semi Ellipt
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Flux leakage sensors have small dia
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The frequency of the alternating fi
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Figure 3.14 Rotating magnet arrange
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3.3 EDDY CURRENT SENSING PROBES For
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As the probe moves over the defect,
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Figure 3.17 Differential surface co
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Figure 3.19 shows an encircling coi
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The application of eddy current sen
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Baffles and tube sheets. Charlie Ch
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Page 87 and 88: Baffles and tube sheets. Charlie Ch
Page 89 and 90: Another important consideration for
Page 91 and 92: 3.4.1 Induction Coils For an induct
Page 93 and 94: If the diameter of a surface coil i
Page 95 and 96: 3.4.2 Hall Effect Sensors Hall effe
Page 97 and 98: Figure 3.21 illustrates the Hall ef
Page 99 and 100: Hall voltage Charlie Chong/ Fion Zh
Page 101 and 102: Since a 1 gauss (G) field produces
Page 103 and 104: Figure 3.22 Effect of magnetic fiel
Page 105 and 106: 3.5 FACTORS AFFECTING FLUX LEAKAGE
Page 107 and 108: Defect & Flux Distribution Charlie
Page 109 and 110: The distance between adjacent defec
Page 111 and 112: 3.6 SIGNAL-TO-NOISE RATIO The signa
Page 113 and 114: With flux leakage testing, signal-t
Page 115 and 116: As shown in Eq. (3.6), test frequen
Page 117 and 118: The characteristic frequency for a
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Page 121 and 122: Figure 3.23 Magnetization or magnet
Page 123 and 124: By taking the product of B and H fo
Page 125 and 126: The rate of change of the opposing
Page 127 and 128: Figure 3.25 Encircling coils establ
Page 129 and 130: Figure 3.27 DC-MFL sensor illustrat
Page 131 and 132: Fill factors apply only to encircli
Page 133 and 134: For best results with encircling co
Page 135 and 136: 3.11 INSTRUMENT DESIGN CONSIDERATIO
Page 137: Charlie Chong/ Fion Zhang Figure 3.
Page 141 and 142: Some general categories of equipmen
Page 143 and 144: Figure 3.29 UniWest-454 EddyView mu
Page 145 and 146: Scanner operation uses a separate c
Page 147 and 148: Figure 3.30 E-Lab model US-450 full
Page 149 and 150: 3.12.3 ETC-2000 Scanner Because of
Page 151 and 152: ETC-2000 scanner features include:
Page 153 and 154: 3.13 INSTITUT DR. FOERSTER Institut
Page 155 and 156: It is possible to provide 100% eddy
Page 157 and 158: Figure 3.33 ET testing of hot coppe
Page 159 and 160: For maximum sensitivity, the Circog
Page 161 and 162: 3.14 MAGNETIC FLUX LEAKAGE TESTING
Page 163 and 164: ASTM E 570 describes magnetic flux
Page 165 and 166: Charlie Chong/ Fion Zhang Figure 3.
Page 167 and 168: Applications involving physical par
Page 169 and 170: Inexpensive 60 Hz eddy current comp
Page 171 and 172: 4. Measure the length of nonwelded
Page 173 and 174: Some general applications for the f
Page 175 and 176: Permanent magnets are the preferred
Page 177 and 178: Robot Charlie Chong/ Fion Zhang
Page 179 and 180: 3.17.1 Introduction In 1911, Dr. He
Page 181 and 182: 3.17.2 Early Applications Stresses
Page 183 and 184: Typical roll failures are caused by
Page 185 and 186: This technique has been found to be
Page 187 and 188: Figure 3.38 A comparison of Barkhau
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Figure 3.39 Three-channel Rollscan
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The appropriate depth of measuremen
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3.17.5 Calibration and Testing Bark
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Comparative studies by Kirsti Titto
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3.17.6 Current Applications Barkhau
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3.17.9 Pipe/Tubing/Sheet/Plate Manu
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EMATs overcome many common ultrason
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3.18.1 EMATs Advantages Over Piezoe
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3.18.3 Recent Applications And Deve
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Figure 3.44 Courtesy of Weld Inspec
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3.19 ALTERNATING CURRENT FIELD MEAS
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3.19.1 Acfm Principles Of Operation
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Figure 3.45 Current flow and induce
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3.19.2 Bx and Bz Components The pre
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3.19.3 Butterfly Plot To aid interp
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3.19.4 Probe Design Standard ACFM p
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Figure 3.48 Flowchart selection of
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3.31 APPLICATIONS One active encode
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Other applications include: • Ins
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Eddy Current Testing at High Temper
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Good Luck Charlie Chong/ Fion Zhang
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Electromagnetic Testing Chapter 3- Electromagnetic Testing

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