Electromagnetic Testing Chapter 3- Electromagnetic Testing

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3.18.2 Basic Theory of Operation A magnetic field is applied to the test piece and the EMAT circuit is placed in the magnetic field. A high-power AC toneburst is driven through the EMAT. This tone burst passes into the test piece and produces eddy currents. The eddy currents interact with the static magnetic field to produce stresses in the metal, generating ultrasonic waves. The frequency of the current, the shape of the EMAT transducer, its position in the magnetic field, and the thickness of the test piece combine to determine the mode of ultrasound generated. The wave mode and frequency determine the type of analysis to be performed. With Lorenz force generation, vertical and horizontal shear waves are typically generated. With magnetic materials, magnetostrictive forces, which have certain benefits compared to Lorenz forces, can also be generated and used to advantage. Charlie Chong/ Fion Zhang
3.18.3 Recent Applications And Developments • Invention of a revolutionary thickness gauge for detecting remaining wall thickness to less than 0.1" for rapid scanning of sheets or pipe. The gauge performed well in an international blind testing at Southwest Research Institute. • Automatic Butt Weld Inspection System (ABWIS®). As part of the production of steel, welders create flash butt welds in large coils of plate.These welds are then scanned with an EMAT system to analyze the validity of the welds. • A flaw detection/thickness gauge for oil field tubular goods. This technology is gaining rapid acceptance as a vastly improved NDE method over existing technology. It has performed well in Arctic conditions at 20° below zero as well as in Saudi Arabian deserts. Charlie Chong/ Fion Zhang
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Electromagnetic Testing Chapter 3-
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Submarine Applications Charlie Chon
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Fion Zhang at Shanghai 6th April 20
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IVONA TTS Capable. Charlie Chong/ F
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Chapter 3. ELECTROMAGNETIC TESTING
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Barkhausen effect The Barkhausen ef
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Barkhausen Noise Charlie Chong/ Fio
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Figure 3.1 Eddy current principle.
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Figure 3.2 Schematic diagram of bas
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Figure 3.3 The effect of conductivi
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Figure 3.3 The effect of conductivi
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Another important influence on coil
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If the conductivity of the material
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Figure 3.5 The effect of a crack on
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FIGURE 8-49 Conductivity curve: (a)
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So far, we have described how eddy
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Figure 3.6 The effects of (a) condu
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3.1.2 Limiting Frequency f g of Enc
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Figure 3.7 The effect of degree of
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Charlie Chong/ Fion Zhang
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Eddy Current Heating Charlie Chong/
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Eddy Current Heating Charlie Chong/
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Eddy currents weaken the original m
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3.2 MAGNETIC FLUX LEAKAGE THEORY Wh
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3D Magnetic Field Charlie Chong/ Fi
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3D Magnetic Field Fig.1 THE PRINCIP
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Based on what we have learned about
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Charlie Chong/ Fion Zhang Figure 3.
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Magnetic Field - Simple Semi Ellipt
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Flux leakage sensors have small dia
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The frequency of the alternating fi
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Figure 3.14 Rotating magnet arrange
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3.3 EDDY CURRENT SENSING PROBES For
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As the probe moves over the defect,
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Figure 3.17 Differential surface co
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Figure 3.19 shows an encircling coi
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The application of eddy current sen
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Baffles and tube sheets. Charlie Ch
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Another important consideration for
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3.4.1 Induction Coils For an induct
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If the diameter of a surface coil i
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3.4.2 Hall Effect Sensors Hall effe
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Figure 3.21 illustrates the Hall ef
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Hall voltage Charlie Chong/ Fion Zh
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Since a 1 gauss (G) field produces
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Figure 3.22 Effect of magnetic fiel
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3.5 FACTORS AFFECTING FLUX LEAKAGE
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Defect & Flux Distribution Charlie
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The distance between adjacent defec
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3.6 SIGNAL-TO-NOISE RATIO The signa
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With flux leakage testing, signal-t
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As shown in Eq. (3.6), test frequen
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The characteristic frequency for a
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Charlie Chong/ Fion Zhang
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Figure 3.23 Magnetization or magnet
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By taking the product of B and H fo
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The rate of change of the opposing
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Figure 3.25 Encircling coils establ
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Figure 3.27 DC-MFL sensor illustrat
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Fill factors apply only to encircli
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For best results with encircling co
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3.11 INSTRUMENT DESIGN CONSIDERATIO
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Charlie Chong/ Fion Zhang Figure 3.
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TABLE 3.2. Comparison of Instrument
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Some general categories of equipmen
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Figure 3.29 UniWest-454 EddyView mu
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Scanner operation uses a separate c
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Figure 3.30 E-Lab model US-450 full
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3.12.3 ETC-2000 Scanner Because of
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ETC-2000 scanner features include:
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Page 155 and 156: It is possible to provide 100% eddy
Page 157 and 158: Figure 3.33 ET testing of hot coppe
Page 159 and 160: For maximum sensitivity, the Circog
Page 161 and 162: 3.14 MAGNETIC FLUX LEAKAGE TESTING
Page 163 and 164: ASTM E 570 describes magnetic flux
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Page 167 and 168: Applications involving physical par
Page 169 and 170: Inexpensive 60 Hz eddy current comp
Page 171 and 172: 4. Measure the length of nonwelded
Page 173 and 174: Some general applications for the f
Page 175 and 176: Permanent magnets are the preferred
Page 177 and 178: Robot Charlie Chong/ Fion Zhang
Page 179 and 180: 3.17.1 Introduction In 1911, Dr. He
Page 181 and 182: 3.17.2 Early Applications Stresses
Page 183 and 184: Typical roll failures are caused by
Page 185 and 186: This technique has been found to be
Page 187 and 188: Figure 3.38 A comparison of Barkhau
Page 189 and 190: Figure 3.39 Three-channel Rollscan
Page 191 and 192: The appropriate depth of measuremen
Page 193 and 194: 3.17.5 Calibration and Testing Bark
Page 195 and 196: Comparative studies by Kirsti Titto
Page 197 and 198: 3.17.6 Current Applications Barkhau
Page 199 and 200: 3.17.9 Pipe/Tubing/Sheet/Plate Manu
Page 201 and 202: EMATs overcome many common ultrason
Page 203: 3.18.1 EMATs Advantages Over Piezoe
Page 207 and 208: Figure 3.44 Courtesy of Weld Inspec
Page 209 and 210: 3.19 ALTERNATING CURRENT FIELD MEAS
Page 211 and 212: 3.19.1 Acfm Principles Of Operation
Page 213 and 214: Figure 3.45 Current flow and induce
Page 215 and 216: 3.19.2 Bx and Bz Components The pre
Page 217 and 218: 3.19.3 Butterfly Plot To aid interp
Page 219 and 220: 3.19.4 Probe Design Standard ACFM p
Page 221 and 222: Figure 3.48 Flowchart selection of
Page 223 and 224: 3.31 APPLICATIONS One active encode
Page 225 and 226: Other applications include: • Ins
Page 227 and 228: Eddy Current Testing at High Temper
Page 229 and 230: Good Luck Charlie Chong/ Fion Zhang
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Electromagnetic Testing Chapter 3- Electromagnetic Testing

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