Electromagnetic Testing Chapter 3- Electromagnetic Testing

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3.17.3 Principles of Measurement Magnetoelastic testing is based on the interaction between magnetostrictive and elastic lattice strains. If a piece of ferromagnetic steel is magnetized, it is also elongated slightly in the direction of the magnetic field. Likewise, if an applied load stretches the steel, it will be slightly magnetic in the direction it is stretched.With compressive loads, the same sort of domain alignment occurs except the resulting magnetism is 90° to the direction of the compressed load. When a magnetizing field is gradually applied to a magnetic material, any unaligned magnetic domains tend to jump into alignment with the induced magnetic field, generating BN, a measurement of compressive and tensile stress. The technique provides a method for rapid comparisons. A more accurate analysis may require calibrating procedures and known loads. Figure 3.38 shows how compressive and tensile stress levels affect BN signal levels. Charlie Chong/ Fion Zhang
Figure 3.38 A comparison of Barkhausen noise levels (top) as a function of magnetoelastic signal level (bottom). Courtesy of American Stress Technologies, Inc. Charlie Chong/ Fion Zhang
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Electromagnetic Testing Chapter 3-
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Submarine Applications Charlie Chon
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Fion Zhang at Shanghai 6th April 20
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IVONA TTS Capable. Charlie Chong/ F
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Chapter 3. ELECTROMAGNETIC TESTING
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Barkhausen effect The Barkhausen ef
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Barkhausen Noise Charlie Chong/ Fio
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Figure 3.1 Eddy current principle.
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Figure 3.2 Schematic diagram of bas
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Figure 3.3 The effect of conductivi
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Figure 3.3 The effect of conductivi
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Another important influence on coil
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If the conductivity of the material
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Figure 3.5 The effect of a crack on
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FIGURE 8-49 Conductivity curve: (a)
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So far, we have described how eddy
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Figure 3.6 The effects of (a) condu
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3.1.2 Limiting Frequency f g of Enc
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Figure 3.7 The effect of degree of
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Charlie Chong/ Fion Zhang
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Eddy Current Heating Charlie Chong/
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Eddy Current Heating Charlie Chong/
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Eddy currents weaken the original m
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3.2 MAGNETIC FLUX LEAKAGE THEORY Wh
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3D Magnetic Field Charlie Chong/ Fi
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3D Magnetic Field Fig.1 THE PRINCIP
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Based on what we have learned about
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Charlie Chong/ Fion Zhang Figure 3.
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Magnetic Field - Simple Semi Ellipt
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Flux leakage sensors have small dia
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The frequency of the alternating fi
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Figure 3.14 Rotating magnet arrange
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3.3 EDDY CURRENT SENSING PROBES For
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As the probe moves over the defect,
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Figure 3.17 Differential surface co
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Figure 3.19 shows an encircling coi
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The application of eddy current sen
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Baffles and tube sheets. Charlie Ch
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Another important consideration for
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3.4.1 Induction Coils For an induct
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If the diameter of a surface coil i
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3.4.2 Hall Effect Sensors Hall effe
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Figure 3.21 illustrates the Hall ef
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Hall voltage Charlie Chong/ Fion Zh
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Since a 1 gauss (G) field produces
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Figure 3.22 Effect of magnetic fiel
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3.5 FACTORS AFFECTING FLUX LEAKAGE
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Defect & Flux Distribution Charlie
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The distance between adjacent defec
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3.6 SIGNAL-TO-NOISE RATIO The signa
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With flux leakage testing, signal-t
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As shown in Eq. (3.6), test frequen
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The characteristic frequency for a
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Charlie Chong/ Fion Zhang
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Figure 3.23 Magnetization or magnet
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By taking the product of B and H fo
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The rate of change of the opposing
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Figure 3.25 Encircling coils establ
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Figure 3.27 DC-MFL sensor illustrat
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Fill factors apply only to encircli
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For best results with encircling co
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Page 139 and 140: TABLE 3.2. Comparison of Instrument
Page 141 and 142: Some general categories of equipmen
Page 143 and 144: Figure 3.29 UniWest-454 EddyView mu
Page 145 and 146: Scanner operation uses a separate c
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Page 157 and 158: Figure 3.33 ET testing of hot coppe
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Page 161 and 162: 3.14 MAGNETIC FLUX LEAKAGE TESTING
Page 163 and 164: ASTM E 570 describes magnetic flux
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Page 179 and 180: 3.17.1 Introduction In 1911, Dr. He
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Page 193 and 194: 3.17.5 Calibration and Testing Bark
Page 195 and 196: Comparative studies by Kirsti Titto
Page 197 and 198: 3.17.6 Current Applications Barkhau
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Page 203 and 204: 3.18.1 EMATs Advantages Over Piezoe
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Page 227 and 228: Eddy Current Testing at High Temper
Page 229 and 230: Good Luck Charlie Chong/ Fion Zhang
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Electromagnetic Testing Chapter 3- Electromagnetic Testing

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