Electromagnetic Testing Chapter 3- Electromagnetic Testing

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E. H. Hall accidentally discovered the Hall effect in 1879 while he was investigating the effect of magnetic forces on current-carrying conductors at John Hopkins University. At that time, he discovered that strong magnetic fields skewed the equal potential lines in a conductor, thus producing a miniature voltage perpendicular to the direction of current flow.With metal conductors, the voltage levels produced were so low that the phenomenon remained a laboratory curiosity until practical development of the semiconductor. In the early 1960s, F. W. Bell, Inc. introduced the first commercially available, low-cost, bulk indium arsenide Hall generators. In 1968, Micro Switch revolutionized the keyboard industry with their introduction of the first solid-state keyboard using Hall effect devices that incorporated the use of a Hall generator and its associated electronic circuit on a single integrated circuit chip. Today Hall effect devices are used in a host of products too numerous to mention. Charlie Chong/ Fion Zhang
Figure 3.21 illustrates the Hall effect principle. When a current-carrying conductor is placed in a magnetic field, a Hall voltage is produced, which is perpendicular to both the direction of current and the magnetic field.The Hall voltage produced is given in Eq. (3.4): V H = (R H / t)(I c )(B sinθ) (3.4) Where: I c = input current B sinθ = perpendicular magnetic field in gauss (G) R H = Hall coefficient t = thickness of the semiconductor Charlie Chong/ Fion Zhang
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Electromagnetic Testing Chapter 3-
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Submarine Applications Charlie Chon
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Fion Zhang at Shanghai 6th April 20
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IVONA TTS Capable. Charlie Chong/ F
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Chapter 3. ELECTROMAGNETIC TESTING
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Barkhausen effect The Barkhausen ef
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Barkhausen Noise Charlie Chong/ Fio
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Figure 3.1 Eddy current principle.
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Figure 3.2 Schematic diagram of bas
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Figure 3.3 The effect of conductivi
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Figure 3.3 The effect of conductivi
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Another important influence on coil
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If the conductivity of the material
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Figure 3.5 The effect of a crack on
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FIGURE 8-49 Conductivity curve: (a)
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So far, we have described how eddy
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Figure 3.6 The effects of (a) condu
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3.1.2 Limiting Frequency f g of Enc
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Figure 3.7 The effect of degree of
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Page 47 and 48: Eddy Current Heating Charlie Chong/
Page 49 and 50: Eddy Current Heating Charlie Chong/
Page 51 and 52: Eddy currents weaken the original m
Page 53 and 54: 3.2 MAGNETIC FLUX LEAKAGE THEORY Wh
Page 55 and 56: 3D Magnetic Field Charlie Chong/ Fi
Page 57 and 58: 3D Magnetic Field Fig.1 THE PRINCIP
Page 59 and 60: Based on what we have learned about
Page 61 and 62: Charlie Chong/ Fion Zhang Figure 3.
Page 63 and 64: Magnetic Field - Simple Semi Ellipt
Page 65 and 66: Flux leakage sensors have small dia
Page 67 and 68: The frequency of the alternating fi
Page 69 and 70: Figure 3.14 Rotating magnet arrange
Page 71 and 72: 3.3 EDDY CURRENT SENSING PROBES For
Page 73 and 74: As the probe moves over the defect,
Page 75 and 76: Figure 3.17 Differential surface co
Page 77 and 78: Figure 3.19 shows an encircling coi
Page 79 and 80: The application of eddy current sen
Page 81 and 82: Baffles and tube sheets. Charlie Ch
Page 89 and 90: Another important consideration for
Page 91 and 92: 3.4.1 Induction Coils For an induct
Page 93 and 94: If the diameter of a surface coil i
Page 95: 3.4.2 Hall Effect Sensors Hall effe
Page 99 and 100: Hall voltage Charlie Chong/ Fion Zh
Page 101 and 102: Since a 1 gauss (G) field produces
Page 103 and 104: Figure 3.22 Effect of magnetic fiel
Page 105 and 106: 3.5 FACTORS AFFECTING FLUX LEAKAGE
Page 107 and 108: Defect & Flux Distribution Charlie
Page 109 and 110: The distance between adjacent defec
Page 111 and 112: 3.6 SIGNAL-TO-NOISE RATIO The signa
Page 113 and 114: With flux leakage testing, signal-t
Page 115 and 116: As shown in Eq. (3.6), test frequen
Page 117 and 118: The characteristic frequency for a
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Page 121 and 122: Figure 3.23 Magnetization or magnet
Page 123 and 124: By taking the product of B and H fo
Page 125 and 126: The rate of change of the opposing
Page 127 and 128: Figure 3.25 Encircling coils establ
Page 129 and 130: Figure 3.27 DC-MFL sensor illustrat
Page 131 and 132: Fill factors apply only to encircli
Page 133 and 134: For best results with encircling co
Page 135 and 136: 3.11 INSTRUMENT DESIGN CONSIDERATIO
Page 137 and 138: Charlie Chong/ Fion Zhang Figure 3.
Page 139 and 140: TABLE 3.2. Comparison of Instrument
Page 141 and 142: Some general categories of equipmen
Page 143 and 144: Figure 3.29 UniWest-454 EddyView mu
Page 145 and 146: Scanner operation uses a separate c
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Figure 3.30 E-Lab model US-450 full
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3.12.3 ETC-2000 Scanner Because of
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ETC-2000 scanner features include:
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3.13 INSTITUT DR. FOERSTER Institut
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It is possible to provide 100% eddy
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Figure 3.33 ET testing of hot coppe
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For maximum sensitivity, the Circog
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3.14 MAGNETIC FLUX LEAKAGE TESTING
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ASTM E 570 describes magnetic flux
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Charlie Chong/ Fion Zhang Figure 3.
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Applications involving physical par
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Inexpensive 60 Hz eddy current comp
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4. Measure the length of nonwelded
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Some general applications for the f
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Permanent magnets are the preferred
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Robot Charlie Chong/ Fion Zhang
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3.17.1 Introduction In 1911, Dr. He
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3.17.2 Early Applications Stresses
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Typical roll failures are caused by
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This technique has been found to be
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Figure 3.38 A comparison of Barkhau
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Figure 3.39 Three-channel Rollscan
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The appropriate depth of measuremen
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3.17.5 Calibration and Testing Bark
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Comparative studies by Kirsti Titto
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3.17.6 Current Applications Barkhau
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3.17.9 Pipe/Tubing/Sheet/Plate Manu
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EMATs overcome many common ultrason
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3.18.1 EMATs Advantages Over Piezoe
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3.18.3 Recent Applications And Deve
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Figure 3.44 Courtesy of Weld Inspec
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3.19 ALTERNATING CURRENT FIELD MEAS
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3.19.1 Acfm Principles Of Operation
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Figure 3.45 Current flow and induce
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3.19.2 Bx and Bz Components The pre
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3.19.3 Butterfly Plot To aid interp
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3.19.4 Probe Design Standard ACFM p
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Figure 3.48 Flowchart selection of
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3.31 APPLICATIONS One active encode
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Other applications include: • Ins
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Eddy Current Testing at High Temper
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Good Luck Charlie Chong/ Fion Zhang
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Electromagnetic Testing Chapter 3- Electromagnetic Testing

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