Guide to STN Patent Databases – Basic Version - Paton - TU Ilmenau
Guide to STN Patent Databases – Basic Version - Paton - TU Ilmenau
Guide to STN Patent Databases – Basic Version - Paton - TU Ilmenau
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214<br />
<strong>Guide</strong> <strong>to</strong> <strong>STN</strong> <strong>Patent</strong> <strong>Databases</strong><br />
available) they are not found because the words searched do not occur in the text available, on date B (abstract<br />
available) they are not found due <strong>to</strong> a new UP date used.<br />
When <strong>to</strong> prefer /UPAB over /UP: A document will only be retrieved once an abstract is available. Hence this field<br />
should be preferred with free text searches. Only changes <strong>to</strong> the abstract or main claim are considered. Documents<br />
not having an abstract will not be retrieved.<br />
28.8.3 Notes on INPADOCDB/INPAFAMDB<br />
28.8.3.1 Display of changes <strong>to</strong> the document<br />
The CHG field. The CHG display field indicates fields where changes have occurred. The contents of the field can<br />
even be searched. The added letters mean: A = AMEND / MODIFIED and C= CHANGED / NEW.<br />
=> E E/CHG<br />
E1 38766 DS A/CHG<br />
E2 93 DS C/CHG<br />
E3 0 --> E/CHG<br />
E4 469033 EPC A/CHG<br />
E5 159166 EPC C/CHG<br />
E6 14475 IC A/CHG<br />
E7 97 IC C/CHG<br />
E8 151806 ICO A/CHG<br />
E9 109573 ICO C/CHG<br />
E10 440 IDT A/CHG<br />
E11 245 IDT C/CHG<br />
E12 42344 IN A/CHG<br />
=> S IN C/CHG AND PA C/CHG AND EPC C/CHG<br />
L1 397 IN C/CHG AND PA C/CHG AND EPC C/CHG<br />
=> D BIB.M CHG.M<br />
L1 ANSWER 1 OF 397 INPADOCDB COPYRIGHT 2007 EPO/FIZ KA on <strong>STN</strong><br />
AN 53024119 INPADOCDB ED 20070426 EW 200717 UP 20070705 UW 200727<br />
TI COMBINATION ANTENNA WITH MANY FEEDING POINTS.<br />
TL English<br />
IN FINN LARRY WILLIAM; BURRELL DENNIS A; FRAGA JOHNNY C; GERTEN LEO J; UTZ<br />
JAMES ROE<br />
INS FINN LARRY WILLIAM; BURRELL DENNIS A; FRAGA JOHNNY C; GERTEN LEO J; UTZ<br />
JAMES ROE<br />
PA DELL PRODUCTS LP<br />
PAS DELL PRODUCTS LP<br />
DT <strong>Patent</strong><br />
PI JP 2007082179 A 20070329<br />
PIT JPA DOC. LAID OPEN TO PUBL. INSPEC. [PUBLISHED FROM 1971 ON]<br />
DAV 20070329 unexamined-printed-without-grant<br />
STA PRE-GRANT PUBLICATION<br />
AI JP 2006-123842 A 20060427<br />
AIT JPA <strong>Patent</strong> application<br />
PRAI US 2005-227402 A 20050915 (USA, 20070322)<br />
PRAIT USA <strong>Patent</strong> application<br />
CHG EPC C; PAS C; PA C; INS C; IN C; TI C<br />
For the following fields the changes are indicated:<br />
ABDE Abstract in German<br />
ABEN Abstract in English<br />
ABES Abstract in Spanish<br />
ABFR Abstract in French<br />
ABOL Abstract in original language<br />
ABOR Abstract in original non-ASCII character set<br />
AI Application information<br />
AIOR Application information, original form<br />
CIT Citations<br />
DF Date in Force (Advertizing German Utilities)
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