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Guide to STN Patent Databases – Basic Version - Paton - TU Ilmenau

Guide to STN Patent Databases – Basic Version - Paton - TU Ilmenau

Guide to STN Patent Databases – Basic Version - Paton - TU Ilmenau

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CHG Change of Owner, Inven<strong>to</strong>r, Applicant<br />

20030603 USCC CERTIFICATE OF CORRECTION<br />

-----------<br />

MEMBER 5<br />

-----------<br />

AN 15054093 INPADOCDB UP 20070719 UW 200729<br />

TI VERTIKALER LEIS<strong>TU</strong>NGS-MOSFET.<br />

VERTICAL POWER MOSFET.<br />

TRANSISTOR A EFFET DE CHAMP MOS VERTICAL DE PUISSANCE.<br />

TL German; English; French<br />

IN DEBOY, GERALD; TIHANYI, JENOE<br />

INS DEBOY GERALD, DE; TIHANYI JENOE, DE<br />

PA SIEMENS AKTIENGESELLSCHAFT; DEBOY, GERALD; TIHANYI, JENOE<br />

PAS SIEMENS AG, DE; DEBOY GERALD, DE; TIHANYI JENOE, DE<br />

DT <strong>Patent</strong><br />

PI WO 9904437 A1 19990128<br />

PIT WOA1 INTERNATIONAL PUBLICATION WITH INTERNATIONAL SEARCH REPORT<br />

FDT WO100000 With international search report;<br />

WO030000 Before expiration of time limit for amending the claims and <strong>to</strong><br />

be republished in the event of the receipt of the amendments<br />

DAV 19990128 examined-printed-without-grant<br />

STA PRE-GRANT PUBLICATION<br />

DS W: JP US<br />

RW (EPO): AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE<br />

AI WO 1998-DE2020 W 19980717 German<br />

AIT WOW International application Number<br />

PRAI DE 1997-19730759 A 19970717 (DEA)<br />

PRAIT DEA <strong>Patent</strong> application<br />

IC.V 6<br />

ICM H01L0029-78<br />

ICS H01L0029-167; H01L0029-32<br />

IPCR H01L0021-336 [I,A]; H01L0029-167 [I,A]; H01L0029-32 [I,A]; H01L0029-76<br />

[I,A]; H01L0029-78 [I,A]; H01L0031-062 [I,A]<br />

H01L0021-02 [I,C*]; H01L0029-02 [I,C*]; H01L0029-66 [I,C*]; H01L0031-06<br />

[I,C*]<br />

EPC H01L0029-78B2; H01L0029-06B2B3R2; H01L0029-167; H01L0029-32<br />

FA AB; ABDE; ABFR; AI; AN; DAV; DS; DT; EPC; ICM; ICS; IN; INS; IPC; IPCR;<br />

LAF; PA; PAS; PI; PIT; PRAI; REP; TI<br />

CHG EPC C; CIT A<br />

LEGAL STA<strong>TU</strong>S<br />

AN 15054093 INPADOCDB<br />

19990128 WOAK + DESIGNATED STATES<br />

WO A1<br />

JP US<br />

19990128 WOAL + DESIGNATED COUNTRIES FOR REGIONAL PATENTS<br />

WO A1<br />

AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE<br />

19990315 WOENP ENTRY INTO THE NATIONAL PHASE IN:<br />

JP 1999 506154 A F<br />

19990506 WO121 EP: THE EPO HAS BEEN INFORMED BY WIPO THAT EP WAS<br />

DESIGNATED IN THIS APPLICATION<br />

20001012 WOENP ENTRY INTO THE NATIONAL PHASE IN:<br />

US 2000 462759 A 20001012 F<br />

2 priorities, 5 applications, 5 publications<br />

35.1.2 Search in IFICLS<br />

=> FIL IFICLS<br />

FILE 'IFICLS' ENTERED<br />

COPYRIGHT (C) 2007 IFI CLAIMS(R) <strong>Patent</strong> Services (IFI)<br />

=> S US6479876/PN<br />

L2 1 US6479876/PN<br />

SEARCH by US patent number (there is no application number<br />

field in IFICLS).<br />

267

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