Guide to STN Patent Databases – Basic Version - Paton - TU Ilmenau
Guide to STN Patent Databases – Basic Version - Paton - TU Ilmenau
Guide to STN Patent Databases – Basic Version - Paton - TU Ilmenau
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CHG Change of Owner, Inven<strong>to</strong>r, Applicant<br />
20030603 USCC CERTIFICATE OF CORRECTION<br />
-----------<br />
MEMBER 5<br />
-----------<br />
AN 15054093 INPADOCDB UP 20070719 UW 200729<br />
TI VERTIKALER LEIS<strong>TU</strong>NGS-MOSFET.<br />
VERTICAL POWER MOSFET.<br />
TRANSISTOR A EFFET DE CHAMP MOS VERTICAL DE PUISSANCE.<br />
TL German; English; French<br />
IN DEBOY, GERALD; TIHANYI, JENOE<br />
INS DEBOY GERALD, DE; TIHANYI JENOE, DE<br />
PA SIEMENS AKTIENGESELLSCHAFT; DEBOY, GERALD; TIHANYI, JENOE<br />
PAS SIEMENS AG, DE; DEBOY GERALD, DE; TIHANYI JENOE, DE<br />
DT <strong>Patent</strong><br />
PI WO 9904437 A1 19990128<br />
PIT WOA1 INTERNATIONAL PUBLICATION WITH INTERNATIONAL SEARCH REPORT<br />
FDT WO100000 With international search report;<br />
WO030000 Before expiration of time limit for amending the claims and <strong>to</strong><br />
be republished in the event of the receipt of the amendments<br />
DAV 19990128 examined-printed-without-grant<br />
STA PRE-GRANT PUBLICATION<br />
DS W: JP US<br />
RW (EPO): AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE<br />
AI WO 1998-DE2020 W 19980717 German<br />
AIT WOW International application Number<br />
PRAI DE 1997-19730759 A 19970717 (DEA)<br />
PRAIT DEA <strong>Patent</strong> application<br />
IC.V 6<br />
ICM H01L0029-78<br />
ICS H01L0029-167; H01L0029-32<br />
IPCR H01L0021-336 [I,A]; H01L0029-167 [I,A]; H01L0029-32 [I,A]; H01L0029-76<br />
[I,A]; H01L0029-78 [I,A]; H01L0031-062 [I,A]<br />
H01L0021-02 [I,C*]; H01L0029-02 [I,C*]; H01L0029-66 [I,C*]; H01L0031-06<br />
[I,C*]<br />
EPC H01L0029-78B2; H01L0029-06B2B3R2; H01L0029-167; H01L0029-32<br />
FA AB; ABDE; ABFR; AI; AN; DAV; DS; DT; EPC; ICM; ICS; IN; INS; IPC; IPCR;<br />
LAF; PA; PAS; PI; PIT; PRAI; REP; TI<br />
CHG EPC C; CIT A<br />
LEGAL STA<strong>TU</strong>S<br />
AN 15054093 INPADOCDB<br />
19990128 WOAK + DESIGNATED STATES<br />
WO A1<br />
JP US<br />
19990128 WOAL + DESIGNATED COUNTRIES FOR REGIONAL PATENTS<br />
WO A1<br />
AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE<br />
19990315 WOENP ENTRY INTO THE NATIONAL PHASE IN:<br />
JP 1999 506154 A F<br />
19990506 WO121 EP: THE EPO HAS BEEN INFORMED BY WIPO THAT EP WAS<br />
DESIGNATED IN THIS APPLICATION<br />
20001012 WOENP ENTRY INTO THE NATIONAL PHASE IN:<br />
US 2000 462759 A 20001012 F<br />
2 priorities, 5 applications, 5 publications<br />
35.1.2 Search in IFICLS<br />
=> FIL IFICLS<br />
FILE 'IFICLS' ENTERED<br />
COPYRIGHT (C) 2007 IFI CLAIMS(R) <strong>Patent</strong> Services (IFI)<br />
=> S US6479876/PN<br />
L2 1 US6479876/PN<br />
SEARCH by US patent number (there is no application number<br />
field in IFICLS).<br />
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