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Guide to STN Patent Databases – Basic Version - Paton - TU Ilmenau

Guide to STN Patent Databases – Basic Version - Paton - TU Ilmenau

Guide to STN Patent Databases – Basic Version - Paton - TU Ilmenau

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34 Family search example<br />

34.1 Search question<br />

Search examples<br />

For the US patent numbered 6,300,146 equivalent applications in other countries or additional US patents are<br />

sought.<br />

34.2 Search in INPAFAMDB<br />

=> FIL INPAFAMDB<br />

FILE 'INPAFAMDB' ENTERED<br />

COPYRIGHT (C) 2008 European <strong>Patent</strong> Office / FIZ Karlsruhe<br />

=> S US 6300146/PN<br />

L1 1 US 6300146 /PN<br />

(US6300146/PN)<br />

=> D<br />

BRIEF is the default format. This format provides a good<br />

overview of the whole patent family.<br />

L1 ANSWER 1 OF 1 INPAFAMDB COPYRIGHT 2008 EPO/FIZ KA on <strong>STN</strong><br />

AN 15190523 INPAFAMDB<br />

TI Halbleiterbauteil sowie Verfahren zur Messung seiner Temperatur.<br />

- HYBRID PACKAGE INCLUDING POWER MOSFET DIE AND CONTROL AND PROTECTION<br />

CIRCUIT DIE WITH SMALLER SENSE MOSFET.<br />

- Hybrid package including a power MOSFET die and a control and protection<br />

circuit die with a smaller sense MOSFET.<br />

- Ionizing bar and method of its fabrication.<br />

INS THIERRY VINCENT, FR<br />

- THIERRY VINCENT<br />

PAS INT RECTIFIER CORP, US<br />

- INT RECTIFIER CORP<br />

IPCR H01L0023-34 [I,A ]; H03K0017-08 [N,A ]; H03K0017-082 [I,A ];<br />

H01L0023-34 [I,C*]; H03K0017-08 [N,C*]; H03K0017-082 [I,C*]<br />

EPC H03K0017-082B<br />

AB (US 6137165 A)<br />

A power MOSFET die and a logic and protection circuit die are mounted on<br />

a common lead frame pad, such as a TO220 lead frame pad. The logic and<br />

protection circuit die includes a MOSFET that is connected in parallel<br />

with the power MOSFET but which is smaller than the power MOSFET and<br />

which dissipates power at a predetermined fraction of that of the power<br />

MOSFET. The logic and protection circuit die also includes a temperature<br />

sensor that is in close proximity <strong>to</strong> the MOSFET and determines the<br />

temperature of the MOSFET. The die also includes another temperature<br />

sensor that is located distant from the MOSFET <strong>to</strong> determine the<br />

temperature of the lead frame. The temperature of the power MOSFET can be<br />

determined from the temperature measured by these two sensors and from<br />

the ratio of the power dissipated by the two MOSFETs.<br />

PATENT FAMILY INFORMATION INPAFAMDB<br />

+-------- PUBLICATIONS --------+ +-------- APPLICATIONS --------+<br />

DE 10031115 A1 20010125 DE 2000-10031115 A 20000626<br />

JP 2001015655 A 20010119 JP 2000-189210 A 20000623<br />

US 6137165 A 20001024 US 1999-344704 A 19990625<br />

US 6300146 B1 20011009 US 2000-549280 A 20000414<br />

+--------- PRIORITIES ---------+<br />

US 1999-344704 A 19990625<br />

US 2000-549280 A 20000414<br />

257

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