Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
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PBGA <strong>Test</strong> <strong>Socket</strong> Resistance at<br />
Cycl<strong>in</strong>g<br />
• <strong>Test</strong> Parameters<br />
– Surface mount pogo socket<br />
– Device temp at test: 120C<br />
– Normalized with golden module at<br />
room temp<br />
– Eutectic BGA device daisy<br />
cha<strong>in</strong>, 35mm, 1mm pitch, 580<br />
I/Os<br />
– Pb free BGA device daisy<br />
cha<strong>in</strong>, 42.5mm, 1.27mm pitch,<br />
1089 I/Os<br />
<strong>Test</strong><strong>in</strong>g Lead Free Area Array Packages <strong>BiTS</strong> 2003<br />
8
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