Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
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<strong>Test</strong> Objective<br />
• Metallurgical Plat<strong>in</strong>g <strong>Test</strong><br />
• To determ<strong>in</strong>e the elemental content of the t<strong>in</strong>lead<br />
and t<strong>in</strong> plated leads<br />
• Sample(s) <strong>Test</strong>ed<br />
- TSSOP – 90% Sn 10% Pb lead, 3 device samples<br />
- TSSOP – 100% Sn lead 3 device samples<br />
• Contactor Variable Resistance <strong>Test</strong><br />
• Focus on contact resistance variability when<br />
contact<strong>in</strong>g 100% Sn plated contact leads with<br />
eng<strong>in</strong>eer<strong>in</strong>g changes to:<br />
- Contact wipe po<strong>in</strong>t of the device lead<br />
- P<strong>in</strong> surface micro roughness<br />
- Elastomer durometer selection