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Burn-in & Test Socket Workshop - BiTS Workshop

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Evaluation Criteria<br />

Overview of Experiment<br />

‣ Contact Resistance / Device Monitor<strong>in</strong>g<br />

‣ Room temp tests, 2 and 20 ball cha<strong>in</strong>s (16 per socket)<br />

‣ Real time monitor<strong>in</strong>g dur<strong>in</strong>g bias burn-<strong>in</strong> (2 per socket)<br />

‣ Ball Stick<strong>in</strong>g<br />

‣ Instron force measurement of socket actuation<br />

‣ Ball Deformation<br />

‣ RVSI scann<strong>in</strong>g for diameter, coplanarity<br />

‣ Witness Marks<br />

‣ Visual <strong>in</strong>spection, impr<strong>in</strong>t measurement for various contacts<br />

‣ Ball Hardness<br />

‣ Hardness test<strong>in</strong>g of solder balls after experiment<br />

‣ Solder Transfer / Migration<br />

‣ Visual <strong>in</strong>spection, cross section<strong>in</strong>g and analysis of <strong>in</strong>terfaces<br />

The Effects of No Lead Solder Balls on <strong>Burn</strong>-<strong>in</strong> <strong>Socket</strong> Design Decisions Page 5

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