Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
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Metallurgical Plat<strong>in</strong>g <strong>Test</strong><br />
• <strong>Test</strong> Method(s) Description:<br />
• Scann<strong>in</strong>g electron microscopy (SEM) with a light<br />
element energy dispersive spectrometer (EDS)<br />
was used to provide the data for the plat<strong>in</strong>g<br />
composition of the two types of leads provided<br />
• Three leads <strong>in</strong> a set of fourteen, the third,<br />
seventh, and twelfth leads had three area<br />
analyses performed on each of the samples<br />
• Area analyses rather than spot analyses were<br />
performed due to the non-homogenous nature of<br />
the t<strong>in</strong> lead plat<strong>in</strong>g composition<br />
• The analyses were performed at an accelerat<strong>in</strong>g<br />
voltage of 20 kV, a work<strong>in</strong>g distance of 13.5 mm,<br />
and at a magnification of 600X
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