Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Create successful ePaper yourself
Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.
Objectives<br />
• Determ<strong>in</strong>e impact of lead free BGA and<br />
CGA on common test and <strong>Burn</strong><strong>in</strong> sockets<br />
(prelim<strong>in</strong>ary f<strong>in</strong>d<strong>in</strong>gs)<br />
– Assess product <strong>in</strong>terconnect lead damage<br />
– Evaluate contact resistance<br />
<strong>Test</strong><strong>in</strong>g Lead Free Area Array Packages <strong>BiTS</strong> 2003<br />
2