Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
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Experimental Detail / Analysis<br />
Stage 2 Summary<br />
‣ Witness Marks<br />
‣ Witness marks clearly visible on all<br />
contact types<br />
‣ Surface area of witness mark used as<br />
criteria<br />
‣ Current Capability, Device<br />
Temperature<br />
‣ Temperature characterization<br />
established operat<strong>in</strong>g parameters for<br />
subsequent stages<br />
‣ 50 mA did not significantly <strong>in</strong>crease<br />
device temperature<br />
0.8mm p<strong>in</strong>ch<br />
witness marks<br />
1.0mm spoon<br />
witness marks<br />
The Effects of No Lead Solder Balls on <strong>Burn</strong>-<strong>in</strong> <strong>Socket</strong> Design Decisions Page 12