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Burn-in & Test Socket Workshop - BiTS Workshop

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Experimental Detail / Analysis<br />

Stage 3 Summary (cont.)<br />

‣ Ball Deformation<br />

‣ No significant difference between<br />

Pb and NoPb for coplanarity and<br />

diameter pre and post stress<br />

‣ All devices well with<strong>in</strong> spec<br />

‣ 200 micron change allowed<br />

for diameter and coplanarity<br />

on 1.0mm<br />

‣ 100 micron change allowed<br />

for diameter and coplanarity<br />

on 0.8mm<br />

‣ Overall: M<strong>in</strong>imal impact after<br />

stress to both ball diameter and<br />

coplanarity<br />

Microns<br />

Microns<br />

200<br />

150<br />

100<br />

50<br />

0<br />

700<br />

600<br />

500<br />

400<br />

300<br />

NoPb<br />

Stress<br />

Average Coplanarity<br />

Pre<br />

Control<br />

Pb<br />

Post Pre Post<br />

Solder Ball / Time<br />

Ball Diameter<br />

Stress<br />

1.0mm<br />

0.8mm<br />

Control<br />

Stress<br />

Control<br />

Stress<br />

Control<br />

NoPb Pb NoPb Pb<br />

Pre Stress Post Stress<br />

0.8mm<br />

1.0mm<br />

Max<br />

M<strong>in</strong><br />

The Effects of No Lead Solder Balls on <strong>Burn</strong>-<strong>in</strong> <strong>Socket</strong> Design Decisions Page 17

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