TPF-C Technology Plan - Exoplanet Exploration Program - NASA

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Chapter 3 configurations, performance will be assessed for sensitivity to polarization and phase and amplitude uniformity. Each parameter must be analyzed over the nominal and goal bandpass and allowable performance degradation (contamination effects) budgeted to assure satisfactory performance over the observatory lifetime. For components other than the primary and secondary mirrors, the variations of angle of incidence are much reduced, so their performance will be more nearly constant over the aperture, but they must also be well controlled and stable at the particular angles of incidence used and over the full bandpass This activity will develop the coating designs and determine the overall system contrast performance when they are incorporated. Small test samples of critical coating candidates will be obtained for evaluation and comparison to the predicted performance during pre-Phase A. One source is a Phase II SBIR by Surface Optics Corporation which will seek to produce uniform thickness (
Optics and Starlight Suppression Technology wavelengths in the bandpass and very low polarization elsewhere. Figure 3-10 shows the performance of this coating design and a similar design based on the original protected-Ag designs of Hass et al. 21 Sensitivity analysis of these low polarizing designs is underway to confirm that their use will allow TPF-C to achieve its required contrast level. Further work by Balasubramanian has also shown that modifications of these basic designs may allow for some polarization compensation, further improving the overall system performance. Integration of these designs with the capabilities of the DM based corrector is also underway to assure that the necessary bandpass for TPF-C and overall system performance can be achieved with such coatings. 3.1.7 Scatterometer Objective The scatterometer testbed provides laboratory testing for model validation of stray and scattered light effects. These effects must be better understood on TPF-C than on prior observatories if the desired contrast is to be achieved. The coronagraph contrast is degraded by diffraction effects, optical surface scatter (e.g., PSD modeling), contamination (particulate and hydrocarbon), and stray light multiple scattering off of baffles, stops, etc. Stray and scattered light are not easily separable. One description attributes stray light to such elements as optical baffles and baffle design (specular effects, bidirectional reflectance distribution function modeling, etc.), while scattered light is composed of diffraction, nonspecular, near- and wide-angle scatter, and contamination. All of these must be modeled and well understood to ensure the required contrast. This testbed provides checks on how the physics of these effects are handled in various engineering codes, judges impacts to the project, and informs the selection of a code for use during baffle design. Approach The scatterometer testbed at GSFC 22 will allow testing of precision laboratory optics against modeling codes. Capabilities within the testbed allow surface testing to levels comparable to the TDM tests across the relevant range of spatial frequencies and coupling of this metrology data to deep scattered light measurements. We will test the modeling of the physics of scatter from surface roughness and contamination. In the past, near-angle scatter measurements have been 21 G. Hass, J.B. Heaney, H. Herzig, J.F. Osantowsky, and J.J. Triolo, “Reflectance and durability of AG mirrors coated with thin layers of Al203 plus reactively deposited silicon oxide,” Appl. Opt. 14, 2639- 2644 (1975) and G. Hass, J.B. Heaney, and J.J. Triolo, “Evaporated AG coated with double layers of Al203 and silicon oxide to produce surface films with low solar absorptivity and high thermal emissivity,” Opt. Comm.8, 183-185 (1973). 22 I. Kuznetsov, D. Content, R. Boucarut, and T. Madison, “Design, performance, and reliability of a high-angular-resolution wide-angular-range large-aperture fully-automated UV scatterometer,” Proc. SPIE Int. Soc. Opt. Eng. 4485 p. 417-428 (2002). 45
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JPL Publication 05-8 Technology Pla
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TECHNOLOGY PLAN TERRESTRIAL PLANET
Page 6 and 7: Recent Highlights Technical progres
Page 8 and 9: Figure i-4. Deformable mirror deliv
Page 10 and 11: Table of Contents Approvals........
Page 12 and 13: 7.5.2 Precision Hexapod............
Page 14 and 15: Chapter 1 Figure 1-1. Artist's impr
Page 16 and 17: Chapter 1 interferometry, continues
Page 18 and 19: Chapter 1 Back end coronagraph opti
Page 20 and 21: Chapter 1 Surrounding the whole tel
Page 22 and 23: Chapter 1 Pol. BS fold/steering Mic
Page 24 and 25: Chapter 1 1.6.5 Sunshield The teles
Page 26 and 27: Chapter 1 expected architecture dow
Page 28 and 29: Chapter 1 Table 1-3. TPF-C Technolo
Page 30 and 31: Chapter 1 3B: Demonstrate, using th
Page 32 and 33: Chapter 2 2 Error Budgets 2.1 Contr
Page 34 and 35: Chapter 2 Error Budget Validation G
Page 36 and 37: Chapter 2 Further, it is shown that
Page 38 and 39: Chapter 2 Table 2-1. Requirement on
Page 40 and 41: Chapter 3 3 Optics and Starlight Su
Page 42 and 43: Chapter 3 are in progress with cont
Page 44 and 45: Chapter 3 Figure 3-5. Coronagraph s
Page 46 and 47: Chapter 3 (though not light-weight
Page 48 and 49: Chapter 3 Table 3-3. ITT Metrology
Page 50 and 51: Chapter 3 observations. The time it
Page 52 and 53: Chapter 3 vacuum-compatible, low-po
Page 54 and 55: Chapter 3 blank size. Westerhoff et
Page 58 and 59: Chapter 3 Figure 3-10: Plots showin
Page 60 and 61: Chapter 3 The wavefront quality of
Page 62 and 63: Chapter 3 Figure 3-13. Optical layo
Page 64 and 65: Chapter 3 algorithms have limitatio
Page 66 and 67: Chapter 3 simulated star source is
Page 68 and 69: Chapter 4 Figure 4-1. Overview of t
Page 70 and 71: Chapter 4 enclosures, and stable la
Page 72 and 73: Chapter 4 facilities from which dat
Page 74 and 75: Chapter 4 Figure 4-5. Microslip Tri
Page 76 and 77: Chapter 4 Figure 4-7. Calibration o
Page 78 and 79: Chapter 4 Figure 4-8. Comparison of
Page 80 and 81: Chapter 4 4.2 Subsystem and System
Page 82 and 83: Chapter 4 Figure 4-11. Schematic of
Page 84 and 85: Chapter 4 Figure 4-12. Fine guiding
Page 86 and 87: Chapter 4 (5) The Fine Steering Mir
Page 88 and 89: Chapter 4 Third, precise thermal co
Page 90 and 91: Chapter 4 giving confidence that fl
Page 92 and 93: Chapter 4 surface polish is nonethe
Page 94 and 95: Chapter 5 TPF-C is planning a suite
Page 96 and 97: Chapter 5 engineering judgment (i.e
Page 98 and 99: Chapter 5 categories, in reality ea
Page 100 and 101: Chapter 5 Table 5-3. Validation of
Page 102 and 103: Chapter 5 5.6.1 Modeling Methodolog
Page 104 and 105: Chapter 5 strength of computer simu
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Chapter 6 6 Instrument Technology a
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Chapter 6 Figure 6-1. Detailed conc
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Chapter 6 The first method is self-
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Chapter 6 super computers and is us
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Chapter 7 7 Plan for Technology Dev
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Chapter 7 Figure 7-1. TPF-C Technol
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Chapter 7 Improvements to the DM ov
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Chapter 7 7.3 Error Budgets 7.3.1 D
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Chapter 7 7.4 Optics and Starlight
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Chapter 7 7.4.2 Apodizing Masks and
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Chapter 7 7.4.4 Wavefront Sensing a
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Chapter 7 7.4.6 Transmissive Optics
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Chapter 7 7.4.8 Scatterometer Scope
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Chapter 7 7.5 Structural, Thermal,
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Chapter 7 7.5.3 Precision Structura
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Chapter 7 model of TPF-C and should
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Chapter 7 7.5.6 Secondary Mirror To
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Chapter 7 7.5.8 Sub-scale EM Sunshi
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Chapter 7 7.6 Integrated Modeling a
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Chapter 7 7.7.3 Advanced Concepts:
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Chapter 8 134
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Appendices Appendix B: TPF-C Detail
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Appendices Appendix D: TPF-C Techno
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Appendices Appendix F: Acronym List
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Appendices RWA SAO SBIR SIM SM SMFA
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