TPF-C Technology Plan - Exoplanet Exploration Program - NASA

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Chapter 4 facilities from which data is collected will require a validated error budget. Note that test repeatability only highlights random errors and does not evaluate systematic errors. Figure 4-3. JPL Precision Dilatometer facility, with depiction of sample test configuration. Figure 4-4. Preliminary thermal strain data obtained on the JPL Precision Dilatometer for Zerodur and ULE. 60
Structural, Thermal, and Spacecraft Technology Material property measurements will not be limited to CTE alone. The Project will establish a list of all material properties required for assessing performance stability using the integrated thermal, structural and optical models. Included in this material property list are all elements in the dynamic and thermal load paths, including joints, cables, etc. Data will be needed for these properties as a function of temperature, wavelength, frequency, and load cycle as appropriate. Published literature data will be reviewed, and if it is established that the quality of the published data does not meet TPF-C accuracy requirements, then additional materials testing will be performed. Accuracy requirements on material property data will be defined later as more analysis is performed to understand the sensitivity of material data error on predicted performance. Allocations for material data error will eventually be folded into the Modeling Uncertainty Factor allocation. Ultimately, all material property data assembled under this endeavor will be gathered within a Project-controlled database for use on all TPF-C modeling activities. Microslip Tribometer Characterization Facility The (Cryogenic) Microslip Tribometer Characterization (MTC) facility will measure the coefficient of friction in the microslip regime well below the onset of gross Coulombic slip. This information is required as a physical parameter within established microslip hysteresis model forms which combine both stress-induced and roughness-induced microslip. Data will be collected for representative materials of frictional interfaces, such as hinges and latches, with varying surface roughness specifications and over the temperature range of 305 K and 20 K to investigate thermal sensitivities. The MTC, shown in Figure 4-5, is designed, built, and calibrated in air by Dr. Jason Hinkle at the University of Colorado. The apparatus will be delivered to JPL to be placed within a thermally controlled cryogenic vacuum chamber. Representative data sets are shown in Figure 4-6. Data collected on this facility will be enclosed in the TPF-C Project Material Database. Precision Sub-Structure Test Facility The Precision Sub-Structure (PSS) test facility will be developed at JPL to characterize the thermo-mechanical stability of composite materials, composite structure sub-assemblies, and eventually actual flight hardware including hinges and latches. The facility will derive experience gained on the Precision Dilatometer test facility to incorporate a sub-nm interferometric metrology system within a thermally controlled vacuum chamber to enable distortion and strain measurements for these mechanical sub-assemblies. The current testbed goal is to achieve better than 1-nm measurement accuracy over a 1 minute time interval, which is consistent with current requirements on the SM tower stability. Better measurement performances have already been achieved on the Precision Dilatometer test facility and the SIM Thermo-Optical Mechanical testbeds, so the measurement capability itself is not seen as a risk. The immediate goal will be to collect property data for non-optical materials. The focus will be on measuring and understanding the thermal strain, CTE, material variability, microdynamics, and dimensional stability of proposed composite materials on TPF-C. Of special interest are the materials forming the PM support structure, the SM tower, and the coronagraph optical bench. Over time the facility will be used to investigate the dimensional stability and thermal sensitivity of critical sub-assemblies such as bonded composite parts, bearings, hinges and latches, and 61
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JPL Publication 05-8 Technology Pla
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TECHNOLOGY PLAN TERRESTRIAL PLANET
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Recent Highlights Technical progres
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Figure i-4. Deformable mirror deliv
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Table of Contents Approvals........
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7.5.2 Precision Hexapod............
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Chapter 1 Figure 1-1. Artist's impr
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Chapter 1 interferometry, continues
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Chapter 1 Back end coronagraph opti
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Chapter 1 Surrounding the whole tel
Page 22 and 23: Chapter 1 Pol. BS fold/steering Mic
Page 24 and 25: Chapter 1 1.6.5 Sunshield The teles
Page 26 and 27: Chapter 1 expected architecture dow
Page 28 and 29: Chapter 1 Table 1-3. TPF-C Technolo
Page 30 and 31: Chapter 1 3B: Demonstrate, using th
Page 32 and 33: Chapter 2 2 Error Budgets 2.1 Contr
Page 34 and 35: Chapter 2 Error Budget Validation G
Page 36 and 37: Chapter 2 Further, it is shown that
Page 38 and 39: Chapter 2 Table 2-1. Requirement on
Page 40 and 41: Chapter 3 3 Optics and Starlight Su
Page 42 and 43: Chapter 3 are in progress with cont
Page 44 and 45: Chapter 3 Figure 3-5. Coronagraph s
Page 46 and 47: Chapter 3 (though not light-weight
Page 48 and 49: Chapter 3 Table 3-3. ITT Metrology
Page 50 and 51: Chapter 3 observations. The time it
Page 52 and 53: Chapter 3 vacuum-compatible, low-po
Page 54 and 55: Chapter 3 blank size. Westerhoff et
Page 56 and 57: Chapter 3 configurations, performan
Page 58 and 59: Chapter 3 Figure 3-10: Plots showin
Page 60 and 61: Chapter 3 The wavefront quality of
Page 62 and 63: Chapter 3 Figure 3-13. Optical layo
Page 64 and 65: Chapter 3 algorithms have limitatio
Page 66 and 67: Chapter 3 simulated star source is
Page 68 and 69: Chapter 4 Figure 4-1. Overview of t
Page 70 and 71: Chapter 4 enclosures, and stable la
Page 74 and 75: Chapter 4 Figure 4-5. Microslip Tri
Page 76 and 77: Chapter 4 Figure 4-7. Calibration o
Page 78 and 79: Chapter 4 Figure 4-8. Comparison of
Page 80 and 81: Chapter 4 4.2 Subsystem and System
Page 82 and 83: Chapter 4 Figure 4-11. Schematic of
Page 84 and 85: Chapter 4 Figure 4-12. Fine guiding
Page 86 and 87: Chapter 4 (5) The Fine Steering Mir
Page 88 and 89: Chapter 4 Third, precise thermal co
Page 90 and 91: Chapter 4 giving confidence that fl
Page 92 and 93: Chapter 4 surface polish is nonethe
Page 94 and 95: Chapter 5 TPF-C is planning a suite
Page 96 and 97: Chapter 5 engineering judgment (i.e
Page 98 and 99: Chapter 5 categories, in reality ea
Page 100 and 101: Chapter 5 Table 5-3. Validation of
Page 102 and 103: Chapter 5 5.6.1 Modeling Methodolog
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Page 106 and 107: Chapter 6 6 Instrument Technology a
Page 108 and 109: Chapter 6 Figure 6-1. Detailed conc
Page 110 and 111: Chapter 6 The first method is self-
Page 112 and 113: Chapter 6 super computers and is us
Page 114 and 115: Chapter 7 7 Plan for Technology Dev
Page 116 and 117: Chapter 7 Figure 7-1. TPF-C Technol
Page 118 and 119: Chapter 7 Improvements to the DM ov
Page 120 and 121: Chapter 7 7.3 Error Budgets 7.3.1 D
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Chapter 7 7.4 Optics and Starlight
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Chapter 7 7.4.2 Apodizing Masks and
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Chapter 7 7.4.4 Wavefront Sensing a
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Chapter 7 7.4.6 Transmissive Optics
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Chapter 7 7.4.8 Scatterometer Scope
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Chapter 7 7.5 Structural, Thermal,
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Chapter 7 7.5.3 Precision Structura
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Chapter 7 model of TPF-C and should
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Chapter 7 7.5.6 Secondary Mirror To
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Chapter 7 7.5.8 Sub-scale EM Sunshi
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Chapter 7 7.6 Integrated Modeling a
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Chapter 7 7.7.3 Advanced Concepts:
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Chapter 8 134
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Appendices Appendix B: TPF-C Detail
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Appendices Appendix D: TPF-C Techno
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Appendices Appendix F: Acronym List
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Appendices RWA SAO SBIR SIM SM SMFA
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TPF-C Technology Plan - Exoplanet Exploration Program - NASA

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