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Understanding Smart Sensors - Nomads.usp

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Packaging, Testing, and Reliability Implications of <strong>Smart</strong>er <strong>Sensors</strong> 247[17] Reedholm, J., and T. Turner, “Wafer-Level Reliability,” Microelectronics ManufacturingTechnology, Apr. 1991, pp. 28–32.[18] Frank, R., and D. Zehrbach, “Testing the System on a Chip,” Proc. <strong>Sensors</strong> Expo, San Jose,CA, May 19–21, 1998, pp. 235–238.

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