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Tecnai on-line help manual -- Alignments - UT Southwestern

Tecnai on-line help manual -- Alignments - UT Southwestern

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<str<strong>on</strong>g>Tecnai</str<strong>on</strong>g> <strong>on</strong>-<strong>line</strong> <strong>help</strong> <strong>Alignments</strong> 12<str<strong>on</strong>g>Tecnai</str<strong>on</strong>g> 12 Software versi<strong>on</strong> 2objective and diffracti<strong>on</strong> lenses and stigmators switch as do the functi<strong>on</strong>s of the objective and selectedareaapertures.Lens and aperture functi<strong>on</strong>s in HM (objective lens <strong>on</strong>) and LM (objective lens off)High MagnLow MagnObj. lens Image focus Diffracti<strong>on</strong> (LAD) focusDiff. lens Diffracti<strong>on</strong> focus Image focusObj. aperture C<strong>on</strong>trast forming Area selecti<strong>on</strong>SA aperture Area selecti<strong>on</strong> C<strong>on</strong>trast formingObj. stigmator Image stigmati<strong>on</strong> Diffracti<strong>on</strong> stigmati<strong>on</strong>Diff. stigmator Diffracti<strong>on</strong> stigmati<strong>on</strong> Image stigmati<strong>on</strong>TWIN-type objective lensesMost <str<strong>on</strong>g>Tecnai</str<strong>on</strong>g> microscopes are equipped with a TWIN-type objective lens (the variants BioTWIN, TWIN,S-TWIN and U-TWIN). The lens design and the two resulting basic optical modes, the microprobe andnanoprobe modes, are discussed separately in more detail.3.3 Deflecti<strong>on</strong> coilsThroughout the microscope, the path followed by the electr<strong>on</strong> beam is affected by a number of deflecti<strong>on</strong>coils, mounted in different locati<strong>on</strong>s. Deflecti<strong>on</strong> coils play an essential role in the alignment of themicroscope and are used for aligning the gun, beam, objective lens, magnificati<strong>on</strong> system (image anddiffracti<strong>on</strong> shifts to the screen center) and detector alignments (image or diffracti<strong>on</strong> shifts to a detectorthat is situated off the optical axis). Most of the steps in the alignment procedures either align thedeflecti<strong>on</strong> coils themselves or use the deflecti<strong>on</strong> coils to align another electr<strong>on</strong>-optical element.In principle a single deflecti<strong>on</strong> coil is sufficient for a particular acti<strong>on</strong>, provided that it is mounted at thelevel where its acti<strong>on</strong> is needed. In practice, such arrangements are not feasible due to space limitati<strong>on</strong>sor other c<strong>on</strong>straints. All deflecti<strong>on</strong>s are d<strong>on</strong>e therefore through double deflecti<strong>on</strong> coils that are situated atanother level in the microscope.A deflecti<strong>on</strong> coil is a set of coils <strong>on</strong> either side of the electr<strong>on</strong> beam. If<strong>on</strong>e is given a positive magnetic field and the other <strong>on</strong>e a negative <strong>on</strong>e,the electr<strong>on</strong>s in the beam will be attracted by the positive field andrepelled by the other, leading to a deflecti<strong>on</strong> towards the positive coil.The actual coils are extended over arcs of 120°. The arcs are used togenerate a homogeneous magnetic field.By arranging the coils in sets of two, mounted perpendicular to eachother (X and Y directi<strong>on</strong>s), the beam can be deflected into any directi<strong>on</strong>by a suitable combinati<strong>on</strong> of x and y. The deflecti<strong>on</strong> coils are alwaysmounted in sets of two above another (so-called double deflecti<strong>on</strong>coils). Use of double deflecti<strong>on</strong> coils involves the important c<strong>on</strong>cept ofpivot points as explained below.Each microscope has three sets of double deflecti<strong>on</strong> coils: the gun coils just underneath the electr<strong>on</strong> gun(or underneath the high-tensi<strong>on</strong> accelerator in case of 200 or 300 kV instruments); the beam deflecti<strong>on</strong>coils above the objective lens; and the image deflecti<strong>on</strong> coils below the objective lens. An additi<strong>on</strong>al,more simple, <strong>on</strong>e-directi<strong>on</strong>al coil forms the microscope shutter that is used for exposure of the negatives.

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