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Numonyx <strong>Wireless</strong> <strong>Flash</strong> <strong>Memory</strong> (<strong>W30</strong>)<br />
Figure 23: Transient Equivalent Testing Load Circuit<br />
Note: See Table 16 for component values.<br />
Table 16: Test Configuration Component Values for Worst Case Speed Conditions<br />
Test Configuration C L (pF) R 1 (kΩ) R 1 (kΩ)<br />
VCCQMin Standard Test 30 25 25<br />
Note: CL includes jig capacitance.<br />
Figure 24: Clock Input AC Waveform<br />
8.8 <strong>Flash</strong> Device Capacitance<br />
T A = +25 °C, f = 1 MHz<br />
Symbol Parameter §<br />
Device<br />
Under Test<br />
CLK [C]<br />
V IH<br />
V IL<br />
R202<br />
November 2007 Datasheet<br />
Order Number: 290702-13 47<br />
C L<br />
R201<br />
V CCQ<br />
R203<br />
R 1<br />
R 2<br />
Out<br />
Typ Max Unit Condition<br />
C IN Input Capacitance 6 8 pF V IN = 0.0 V<br />
C OUT Output Capacitance 8 12 pF V OUT = 0.0 V<br />
C CE CE# Input Capacitance 10 12 pF V IN = 0.0 V<br />
§ Sampled, not 100% tested.
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