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Nanotechnology-Enabled Sensors

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Input<br />

IDTs<br />

Shear movement of particles<br />

Substrate<br />

Fig. 3.49 Basic layout of a Love mode SAW device.<br />

3.6 Acoustic Wave Transducers 127<br />

SAW devices can be utilized for sensing various physical and chemical<br />

parameters including temperature, acceleration, force, pressure, AC/DC<br />

high voltages, electric fields, magnetic fields, ionic concentration, gas<br />

flow, vapour concentration, viscosity, and in biosensing. 51<br />

SAW devices can be employed as affinity sensors through the addition<br />

of a mass sensitive layer on their active surface. The following equation<br />

describes the frequency shift, Δf, as a result of added mass as a coated thin,<br />

isotropic, non-conducting film on the active area of the device (Fig.<br />

3.48): 64,65<br />

⎡ μ ⎛ λ + μ ⎞⎤<br />

Δf<br />

=<br />

, (3.91)<br />

4 2<br />

2<br />

2<br />

( k1<br />

+ k2<br />

) f0<br />

h ρ – k2<br />

hf0<br />

⎢ ⎜ ⎟⎥<br />

⎣V<br />

⎝ λ + 2μ<br />

r ⎠⎦<br />

Layer<br />

Output<br />

IDTs<br />

The trapped waves<br />

Confined near the surface<br />

where f0 is the operational frequency, k1 and k2 are material constants of<br />

the substrate, Vr is the Rayleigh wave velocity in the piezoelectric substrate,<br />

h is the added coating thickness, ρ is the added coating density, λ is<br />

the Lamb constant for the added coating, and µ is the shear modulus of the<br />

added coating. It can be seen from the equation that there is a linear relationship<br />

between the thickness of the added coating and the frequency<br />

shift. The frequency shift per mass added describes the sensitivity of such<br />

a SAW device.<br />

SAW devices can also be used to monitor changes in conductivity of a<br />

sensing layer. Many metal oxides and conductive polymers change their<br />

conductivity in response to different oxidizing or reducing gas species.<br />

Depositing such materials over the active area of the SAW device can

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