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CHEMICAL VAPOR DEPOSITION OF THIN FILM MATERIALS FOR ...

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MgAl2O4 substrate is showed in Fig.46. Lattice fringes could be clearly seen from both {220}<br />

and {040} planes. The dark area might be from antiphase boundaries as has been reported by R.<br />

Datta, et. al..[163] The area in the red box of Fig.46(a) is Fourier filtered to exhibit the<br />

diffraction information only from the {040} planes. Break of periodicities has been found and<br />

marked with red circles in Fig.46(b). The lattice mismatch and difference of thermal expansion<br />

coefficients could both contribute to the presence of irregular lattice planes at the interface of<br />

thin film growth.<br />

Fig. 45. Bright field TEM image of nickel ferrite on MgAl2O4 deposited under 600˚C. The image is taken under two<br />

beam conditions with g = . Courtesy of Dr. R Datta for taking the TEM image.<br />

Fig. 46. (a) HRTEM image of the interface between nickel ferrite film and MgAl2O4 substrate; (b) Fourier transform<br />

of the area in the red box of the HRTEM image, the as left lattice fringes are from {040} planes. Courtesy of Dr. R<br />

Datta for taking the HRTEM images.<br />

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