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CHEMICAL VAPOR DEPOSITION OF THIN FILM MATERIALS FOR ...

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delay time of 2 seconds between spectrum taking was also set. The TDMAH adsorption was<br />

monitored in the flowing mode (valve open) for the time range of 15 IR spectra (~6 min). After<br />

that, the bubbler valve was closed, when the ATR cell was still under pumping, the automatic IR<br />

spectra taking was still running one by one to monitor the surface desorption/reaction process<br />

until the preset number of spectra is reached. The first 15 spectra taken in the flowing mode are<br />

used to simulate the precursor pulse step in an practical ALD cycle, and the second 15 spectra in<br />

the pumping mode were used to simulate the purging step in an ALD cycle. These ATR-FTIR<br />

experiments were carried out under different crystal temperatures from room temperature to<br />

250˚C. In each experiment, a spectrum of the bare crystal was taken before the TDMAH vapor<br />

was introduced into the ATR cell and used for background subtraction.<br />

The as used Si(100) ATR crystal was prepared to hydrogenated silicon surface by the<br />

procedures below:<br />

1. Sequentially ultra sonication by organic solvents acetone and methanol (2 min each).<br />

2. Rinse with DI water for 2 min.<br />

3. Cleaning with a 1:1:5 solution of NH4OH+H2O2+DI H2O at 80˚C for 10 min to remove the<br />

organic contaminants.<br />

4. Soaking in diluted BOE (buffered oxide etch, NH4F:HF = 10:1, BOE:DI water = 1:5) for 20 s<br />

to remove the oxide layer.<br />

5. Cleaning with a 1:1:6 solution of HCl+H2O2+DI H2O at 80˚C for 10 min to remove metallic<br />

(ionic) contaminants.<br />

6. Repeat step 4.<br />

7. Rinse with DI water for 10 min.<br />

52

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