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CHEMICAL VAPOR DEPOSITION OF THIN FILM MATERIALS FOR ...

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the existence of both physisorbed and small amount of chemisorbed TDMAH molecules on the<br />

surface.<br />

Fig. 26. Change of ratio of peak 2770 cm -1 to the whole C-H stretching area in the period of adsorption and<br />

desorption at different substrate temperatures.<br />

The profile of Si-H bonds changing on the ATR silicon crystal surface in the period of<br />

TDMAH adsorption and desorption at different crystal temperatures is showed in Fig.27. As one<br />

can see, at 100˚C, there is almost no change of surface Si-H bonds in the adsorption and<br />

desorption process. Starting from 150˚C, the introduction of TDMAH induced apparent<br />

subtraction of surface Si-H bonds and after stopping TDMAH flow the surface Si-H bonds kept<br />

in a stable level. Sufficient thermal energy is achieved above 150˚C for the reaction between<br />

TDMAH and Si-H bonds to happen. The stable Si-H bonds after TDMAH introduction indicates<br />

that the thermal energy itself can not break these bonds. The reaction of surface Si-H bonds with<br />

the thermally activated (or decomposed) TDMAH molecules is the main way for surface bonds<br />

subtraction.[149]<br />

58

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