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(a) About photoluminescence from a single kind of emitter in multilayer conguration tel-00916300, version 1 - 10 Dec 2013 The position and intensity of the emission peaks with regard to variation in thicknesses and refractive indices were analyzed, for the case of single kind of emitter in multilayers. Considering a typical example of a 300 nm lm, the range of total thicknesses was chosen between 250 to 350 nm in steps of 10 nm for simulations. This was done to account for the inuence of the possible uncertainity in the thickness determination, on the emission behaviour. Similarly, considering the uncertainity in refractive index estimation, the real part n 2 was varied between n 2 ± ∆n for a given thickness, where ∆n ranges between ±0.05 in steps of 0.01. Inuence of slight variations in Figure 5.17: refractive index, ∆n on emission. ∆n varies between ±0.05 in steps of 0.01. [∆n = 0 corresponds to n 1.95eV obtained by ellipsometry (here, n 1.95ev = 1.8)]. Figure 5.17 shows the emission spectra of a multilayer thin lm with single kind of emitter leading to the appearance of peak (2) of the experimentally obtained spectra. The thickness of the lm is xed as 250 nm, and the inuence of slight variations in refractive index is analyzed. The results indicate that even with a slight variation of refractive index such as ∆n=±0.01, there is an inuence on the emission intensity. It can be seen from this gure, that with increasing refractive index, there is a drop in the emission intensity while the peak position remains xed. This decrease of the emission intensity may be attributed to the prole of the pump within the lm since the pump intensity decreases with increasing refractive indices. Figure 5.18 shows the inuence of refractive index variation on lms with four dierent thicknesses ranging between 250 nm to 350 nm. It is interesting to note that, the emission spectra exhibits a non-monotonous trend of refractive index inuence, with varying thicknesses. For the case of 270 nm, the observations are similar to those from gure 5.17, while for 300 nm, ∆n has a negligible change in the emission spectra and for 330 nm, the trend has reversed from what was observed for thicknesses lower than 300 nm. With further increase of total thickness to 350 nm, the emission spectra again show negligible variation with 156
(a) 270nm. (b) 300nm. tel-00916300, version 1 - 10 Dec 2013 (c) 330nm. (d) 350nm. Figure 5.18: Eect of total thickness, and refractive index on the emission spectra. refractive indices. This indicates that the inuence of the thickness and refractive index of the thin lm on the emission spectra is not straight-forward. Figures 5.19(a and b) show the emission spectra and maximum emission peak intensity respectively, simulated from materials with same refractive index values but dierent thicknesses. It can be seen that there is a signicant eect on the luminescence intensity by varying thicknesses in steps as small as 10 nm. These results caution us regarding the commonly used normalization to thickness for comparison of intensities in the PL analysis. 157
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UNIVERSITÉ de CAEN BASSE-NORMANDIE
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tel-00916300, version 1 - 10 Dec 20
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2.1.1 Radiofrequency Magnetron Reac
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tel-00916300, version 1 - 10 Dec 20
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3.21 Inuence of sublayer thicknesse
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tel-00916300, version 1 - 10 Dec 20
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tel-00916300, version 1 - 10 Dec 20
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Introduction State of the art tel-0
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as the thickness of the lm, the pat
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Chapter 1 Role of Silicon in Photov
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mono-, poly- and amorphous silicon,
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Figure 1.3: A typical solar cell ar
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occurance of this three body event
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tel-00916300, version 1 - 10 Dec 20
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Shockley-Queisser limit of 31% [Sho
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Figure 1.12: materials. Energy diag
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tel-00916300, version 1 - 10 Dec 20
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Background of this thesis: A new me
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Chapter 2 Experimental techniques a
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maximum power into the plasma. (a)
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Figure 2.2: Illustration of sample
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Ray Diraction, X-Ray Reectivity, El
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(a) Normal Incidence. (b) Oblique (
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to equation 2.4, when X-ray beam st
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investigation. This value is obtain
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e seen that large θ (here, θ is u
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Figure 2.12: Raman spectrometer-Sch
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Experimental set-up and working tel
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ˆ The presence of Si from SiO 2 or
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2.2.7 Spectroscopic Ellipsometry Pr
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k(E) = f j(ω − ω g ) 2 (ω −
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tel-00916300, version 1 - 10 Dec 20
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Figure 2.20: Schematic diagram of t
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Chapter 3 A study on RF sputtered S
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(a) Deposition rate. (b) Refractive
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Thus, by knowing the refractive ind
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tel-00916300, version 1 - 10 Dec 20
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P Ar (mTorr) P H2 (mTorr) r H (%) 1
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such a peak was witnessed in [Quiro
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the host SiO 2 matrix leading to an
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initiated in this thesis, for the g
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P Si (W/cm 2 ) x = 0/Si Bruggemann
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tel-00916300, version 1 - 10 Dec 20
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Figure 3.15: Absorption coecient cu
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Aim of the study To see the inuence
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It can be seen that there is a sign
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3.8.4 Inuence of SiO 2 barrier thic
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Chapter 4 A study on RF sputtered S
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4.2.2 Structural analysis (a) Fouri
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(a) FTIR spectra of NRSN, Si 3 N 4
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tel-00916300, version 1 - 10 Dec 20
Page 123 and 124: Figure 4.15: Absorption coecient sp
Page 125 and 126: A multilayer composed of 100 patter
Page 127 and 128: multilayered conguration. Therefore
Page 129 and 130: around 1250 cm −1 . The blueshift
Page 131 and 132: tel-00916300, version 1 - 10 Dec 20
Page 133 and 134: tion but within a dierence of one o
Page 135 and 136: sample peak 1 (eV) peak 2 (eV) peak
Page 137 and 138: (a) 1min annealing vs. T A . (b) 1h
Page 141 and 142: (a) Brewster incidence. (b) Normal
Page 145 and 146: increases for the 50 patterned samp
Page 147 and 148: - Peak (3) and (c): 1.8-1.95 eV Die
Page 149 and 150: 4.10.2 Eect of Si-np Size distribut
Page 155 and 156: Chapter 5 Photoluminescence emissio
Page 157 and 158: As seen from gure 5.1, a part of th
Page 159 and 160: function of wavelength consists of
Page 163 and 164: In the case of our multilayers, the
Page 165 and 166: ⎛ ⎜ ⎝ A ′ 2 B ′ 2 1 ⎞
Page 167 and 168: dN 3 dt = N 2 τ 23 − (σ em. φ
Page 169 and 170: Figure 5.12: The shapes of k(λ) an
Page 171 and 172: 5.4 Discussion on the choice of inp
Page 173: tting operations show the presence
Page 177 and 178: (a) σ emis.max. = 8.78 x 10 −18
Page 179 and 180: (a) 50(3/1.5) (b) 50(3/3) tel-00916
Page 181 and 182: (a) Integrated population of excite
Page 183 and 184: two kinds of emitters in SRSO subla
Page 185 and 186: Conclusion and future perspectives
Page 187 and 188: 4. Investigating the origin of phot
Page 189 and 190: Bibliography [Abeles 83] B. Abeles
Page 191 and 192: [Carlson 76] D. E. Carlson & C. R.
Page 193 and 194: [Di 10] D. Di, I. Perez-Wur, G. Con
Page 195 and 196: [Gritsenko 99] V. A. Gritsenko, K.
Page 197 and 198: [Kaiser 56] W. Kaiser, P. H. Kech &
Page 199 and 200: [Mandelkorn 62] J. Mandelkorn, C. M
Page 201 and 202: [Pavesi 00] L. Pavesi, L. D. Negro,
Page 203 and 204: [Sopori 96] B. L. Sopori, X. Deng,
Page 205 and 206: [Weng 93] Y. M. Weng, Zh. N. fan &
Page 207 and 208: and the tangential components of th
Page 209 and 210: Appendix II Trials σ em.max (x10
Page 211: Résumé tel-00916300, version 1 -
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