Films minces à base de Si nanostructuré pour des cellules ...

tel-00916300, version 1 - 10 Dec 2013
Figure 2.17: Step 1 and 2 of ellipsometry modelling.
Informations extracted in this thesis
ˆ The refractive index of the thin lm material is known from which we can estimate
the composition of the lm in terms of Si excess. Using this refractive
index, Si excess in the material can also be evaluated by calculations involving
Bruggeman eective medium approximation [Bruggeman 35]. Contrary to the
FTIR technique, Bruggeman calculations account for the nucleated Si particles
but do not consider the fraction of free unbounded Si atoms or smaller
agglomerates.
ˆ The thickness of the sample is determined to a good degree of accuracy (