Films minces à base de Si nanostructuré pour des cellules ...

Figure 2.20: Schematic diagram of the photoluminescence experimental set-up.
tel-00916300, version 1 - 10 Dec 2013
Informations extracted in this thesis
ˆ The information on the presence of Si-nps and radiative defects can be obtained
from the position and shape of the luminescence peak.
ˆ The shift of the PL peak position with varying deposition parameters yield
information on the size of Si-nps
ˆ The shape and the intensity of the PL spectra can be used to extract the informations
such as the eect with annealing temperature, the sample thickness
and interference phenomena especially in multilayers.
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