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Asymmetric fluid-structure dynamics in nanoscale imprint lithography

Asymmetric fluid-structure dynamics in nanoscale imprint lithography

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which are selectively compliant. In the multi-impr<strong>in</strong>t mach<strong>in</strong>e, these flexures arepassive compliant and allow α-β rotations, as shown <strong>in</strong> Figure 2.3, and ztranslation while m<strong>in</strong>imiz<strong>in</strong>g γ rotations and x-y translations.The selective compliance of the distributed flexure allows the flexure toself-correct any orientation alignment with<strong>in</strong> its range of motion to m<strong>in</strong>imize thebase layer wedge profile when the etch barrier is squeezed towards the edges ofthe template. Dur<strong>in</strong>g the separation step excessive lateral displacements maydestroy transferred images, therefore an important design criterion for theorientation stages is to m<strong>in</strong>imize the motions that would cause catastrophicdefects <strong>in</strong> the UV-exposed etch barrier. Thus, the modeled <strong>fluid</strong> pressures aregenerated from a pure squeeze action and the first two terms on the right handside of equation 2.18 disappear.<strong>in</strong>itialtemplatesubstratez,γalignedtemplatey,βx,αFigure 2.3 Two flats show<strong>in</strong>g orientation alignments 3The template is treated as <strong>in</strong>f<strong>in</strong>ite <strong>in</strong> the y direction and only the middle ofthe template along the x direction is considered. This is equivalent to neglect<strong>in</strong>gside leakage so that all y derivatives are zero. The two-dimensional Reynoldsequation becomes3 Figure taken from Choi et al 2000.27

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