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Asymmetric fluid-structure dynamics in nanoscale imprint lithography

Asymmetric fluid-structure dynamics in nanoscale imprint lithography

Asymmetric fluid-structure dynamics in nanoscale imprint lithography

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optically flat quartz plate coated with a layer of chromium. This chromiumplatedquartz plate acted as the wafer and is shown <strong>in</strong> Figure 6.1. The chromiumhas a high reflectivity and acts as a first surface mirror, which has similar opticalproperties to a wafer with a transfer layer. Setscrews were used to hold quartzsubstrate <strong>in</strong> place. To m<strong>in</strong>imize bend<strong>in</strong>g <strong>in</strong> the quartz, alum<strong>in</strong>um plates wereused at the <strong>in</strong>terface between the setscrews and the quartz to distribute the forcefrom the setscrews evenly across the sides of the quartz and provide a flat,uniform clamp<strong>in</strong>g surface. This m<strong>in</strong>imizes high contact stresses and distortion ofthe quartz.Alum<strong>in</strong>um Plates1 × 1 <strong>in</strong>chChromium-PlatedQuartz SubstrateFigure 6.1 Chromium-Plated Quartz Substrate FixtureSecond, a <strong>fluid</strong> dispens<strong>in</strong>g system that could accurately dispense about0.1 µL of <strong>fluid</strong> <strong>in</strong> the gap between the quartz substrate and the template surfacewas not available. The simulations model the <strong>fluid</strong> as a l<strong>in</strong>e with boundaries thatgrow outward from the center. The dispens<strong>in</strong>g system <strong>in</strong> the actual SFIL processwrites a <strong>fluid</strong> pattern that leaves no air bubbles trapped <strong>in</strong> the etch barrier andreduces the amount of force required to squeeze the <strong>fluid</strong> to ultra-th<strong>in</strong> film78

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