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Handbook of Size Exclusion Chromatography and Related ...

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Table 1 Summary <strong>of</strong> Methods for Increased SEC Throughput<br />

Approach Advantages Disadvantages Beneficial for...<br />

Parallization No method change<br />

Easy to implement<br />

No additional training<br />

HighSpeed No method change<br />

Uses existing<br />

equipment<br />

1 : 1 Application<br />

transfer<br />

No additional training<br />

Minimizes investment<br />

(column only)<br />

SEC separations in<br />

1 min<br />

Time gain ca. 10<br />

No additional shear<br />

High efficiency<br />

Runs with conventional<br />

s<strong>of</strong>tware<br />

FIA Uses existing<br />

equipment<br />

Saves eluent<br />

Short or thin<br />

columns<br />

Uses existing<br />

equipment<br />

Minimizes<br />

investment<br />

Saves eluent<br />

Runs with current<br />

s<strong>of</strong>tware<br />

© 2004 by Marcel Dekker, Inc.<br />

High investment cost<br />

High maintenance<br />

Higher operating cost<br />

More people<br />

More space<br />

Limited throughput gain<br />

Sample increase <strong>of</strong><br />

up to 3<br />

No eluent savings QC/QA<br />

Increased<br />

throughput (10 )<br />

Use with existing<br />

methods<br />

No separation<br />

Limited time gain<br />

Not applicable for<br />

copolymers/blends<br />

Requires expensive<br />

equipment (LS <strong>and</strong>/<br />

or viscometer)<br />

Only primary<br />

information (conc.,<br />

Mw, IV)<br />

Needs method change<br />

Needs special s<strong>of</strong>tware<br />

Limited time saving<br />

Needs method adaption<br />

Optimization <strong>of</strong> injection<br />

volumes<br />

Optimization <strong>of</strong><br />

detection systems<br />

Shear degradation<br />

Low efficiency<br />

Needs training<br />

Limited throughput<br />

increase<br />

Samples difficult to<br />

separate<br />

Utilizes existing<br />

instruments<br />

Low resolution<br />

applications<br />

Low time-saving<br />

requirements<br />

Single detector<br />

applications

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