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Design Challenges: Avoiding the Pitfalls, winning the game - Xilinx

Design Challenges: Avoiding the Pitfalls, winning the game - Xilinx

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POWER MANAGEMENT<br />

Performance vs. Power:<br />

Getting <strong>the</strong> Best of Both Worlds<br />

<strong>Xilinx</strong> conquers <strong>the</strong> 90 nm inflection point.<br />

by Anil Telikepalli<br />

Marketing Manager, Virtex Solutions<br />

<strong>Xilinx</strong>, Inc.<br />

anil.telikepalli@xilinx.com<br />

The debate over which high-performance<br />

90 nm FPGA has <strong>the</strong> lowest power is heating<br />

up. The industry has crossed a critical<br />

inflection point at <strong>the</strong> 90 nm process,<br />

where performance competes with power<br />

and <strong>the</strong>rmal budgets. Customers want as<br />

much performance as possible, but increasingly<br />

<strong>the</strong> decision about which FPGA to<br />

use is based on which device consumes <strong>the</strong><br />

least amount of power.<br />

Excessive power is expensive in many<br />

ways. It creates <strong>the</strong> need for special design<br />

and operational considerations – everything<br />

from heat sinks to fans to sophisticated<br />

heat exchangers. Even <strong>the</strong> cost of<br />

larger power supplies must be considered.<br />

Perhaps <strong>the</strong> most critical issue is <strong>the</strong><br />

effect excessive power can have on reliability.<br />

As junction temperatures rise, transistors<br />

consume more power, fur<strong>the</strong>r<br />

increasing <strong>the</strong> device temperature. Left<br />

unchecked, this phenomenon leads to <strong>the</strong>rmal<br />

runaway. Continuously operating systems<br />

with junction temperatures from<br />

85°C to over 100°C threaten <strong>the</strong> reliability<br />

of <strong>the</strong> device.<br />

52 Xcell Journal Third Quarter 2005

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