Design Challenges: Avoiding the Pitfalls, winning the game - Xilinx
Design Challenges: Avoiding the Pitfalls, winning the game - Xilinx
Design Challenges: Avoiding the Pitfalls, winning the game - Xilinx
Create successful ePaper yourself
Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.
POWER MANAGEMENT<br />
Performance vs. Power:<br />
Getting <strong>the</strong> Best of Both Worlds<br />
<strong>Xilinx</strong> conquers <strong>the</strong> 90 nm inflection point.<br />
by Anil Telikepalli<br />
Marketing Manager, Virtex Solutions<br />
<strong>Xilinx</strong>, Inc.<br />
anil.telikepalli@xilinx.com<br />
The debate over which high-performance<br />
90 nm FPGA has <strong>the</strong> lowest power is heating<br />
up. The industry has crossed a critical<br />
inflection point at <strong>the</strong> 90 nm process,<br />
where performance competes with power<br />
and <strong>the</strong>rmal budgets. Customers want as<br />
much performance as possible, but increasingly<br />
<strong>the</strong> decision about which FPGA to<br />
use is based on which device consumes <strong>the</strong><br />
least amount of power.<br />
Excessive power is expensive in many<br />
ways. It creates <strong>the</strong> need for special design<br />
and operational considerations – everything<br />
from heat sinks to fans to sophisticated<br />
heat exchangers. Even <strong>the</strong> cost of<br />
larger power supplies must be considered.<br />
Perhaps <strong>the</strong> most critical issue is <strong>the</strong><br />
effect excessive power can have on reliability.<br />
As junction temperatures rise, transistors<br />
consume more power, fur<strong>the</strong>r<br />
increasing <strong>the</strong> device temperature. Left<br />
unchecked, this phenomenon leads to <strong>the</strong>rmal<br />
runaway. Continuously operating systems<br />
with junction temperatures from<br />
85°C to over 100°C threaten <strong>the</strong> reliability<br />
of <strong>the</strong> device.<br />
52 Xcell Journal Third Quarter 2005