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222 INSTRUMENTAL LABORATORIES AND TECHNOLOGICAL PILOT PLANTS<br />

INSTRUMENTAL LABORATORIES AND TECHNOLOGICAL<br />

PILOT PLANTS<br />

I. DEPARTMENT OF NUCLEAR METHODS OF MATERIALS ENGINEERING<br />

1. Laboratory of Materials Research<br />

Activity profile: Studies of the structure and properties of materials and historical art objects. Modification<br />

of surface properties of materials by means of intense plasma pulses and ions beams. Synthesis<br />

and studies of new type of materials with predetermined properties (biocidal, fungicidal,<br />

sorptional). Characterization of structural properties of materials using SEM (scanning electron<br />

microscopy), X-ray fiffraction (powder and single crystal). Determination of elemental content of<br />

environmental and geological samples, industrial waste materials, historic glass objects and other<br />

materials by energy dispersive X-ray fluorescence spectrometry using a radioisotope excitation source<br />

as well as a low power X-ray tube and using a 2 kW X-ray tube in total reflection geometry. Determination<br />

of radioactive isotope content in environmental samples and historical glass objects by<br />

gamma spectrometry.<br />

• Scanning electron microscope<br />

DSM 942, LEO-Zeiss (Germany)<br />

Technical data: spatial resolution – 4 nm at 30 kV, and 25 nm at 1 kV; acceleration voltage – up to 30 kV;<br />

chamber capacity – 250x150 mm.<br />

Application: SEM observation of various materials such as metals, polymers, ceramics and glasses.<br />

Determination of characteristic parameters such as molecule and grain size.<br />

• Scanning electron microscope equipped with the attachment for fluorescent microanalysis<br />

BS-340 and NL-2001, TESLA (Czech Republic)<br />

Application: Observation of surface morphology and elemental analysis of various materials.<br />

• Vacuum evaporator<br />

JEE-4X, JEOL (Japan)<br />

Application: Preparation of thin film coatings of metals or carbon.<br />

• Gamma radiation spectrometer<br />

HP-Ge, model GS 6020; Canberra-Packard (USA)<br />

Technical data: detection efficiency for gamma radiation – 60.2%, polarization voltage – 4000 V,<br />

energy resolution (for Co-60) – 1.9 keV, analytical program “GENIE 2000”.<br />

Application: Neutron activation analysis, measurements of natural radiation of materials.<br />

• Gamma spectrometer in low-background laboratory<br />

EGG ORTEC<br />

Technical data: HPGe detector with passive shield; FWHM – 1.9 keV at 1333 keV, relative efficiency<br />

– 92%.<br />

• Total reflection X-ray spectrometer<br />

Pico TAX, Institute for Environmental Technologies (Berlin, Germany)<br />

Technical data: Mo X-ray tube, 2000 W; Si(Li) detector with FHWM 180 eV for 5.9 keV line;<br />

analysed elements – from sulphur to uranium; detection limits – 10 ppb for optimal range of analysed<br />

elements, 100 ppb for the others.<br />

Application: XRF analysis in total reflection geometry. Analysis of minor elements in water (tap, river,<br />

waste and rain water); analysis of soil, metals, raw materials, fly ash, pigments, biological samples.<br />

• X-ray spectrometer<br />

SLP-10180-S, ORTEC (USA)<br />

Technical data: FWHM – 175 eV for 5.9 keV line, diameter of active part – 10 mm, thickness of active<br />

part of detector – 5.67 mm.<br />

Application: X-ray fluorescence analysis.<br />

• Coulter Porometer II<br />

Coulter Electronics Ltd (Great Britain)<br />

Application: Pore size analysis in porous media.<br />

• Vacuum chamber for plasma research<br />

POLVAC Technika Próżniowa

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