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PENELOPE 2003 - OECD Nuclear Energy Agency

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128 Chapter 4. Electron/positron transport mechanics<br />

⎡<br />

= 2 s 3<br />

⎣1 − 1 λ (s) ⎛ ⎞ ⎤<br />

el,1 ⎝<br />

s ⎠ + . . . ⎦ , (4.21)<br />

9 λ (s) 2<br />

el,2 λ (s)<br />

el,2 λ (s)<br />

el,1<br />

which does not differ much from the exact value given by eq. (4.19). From these facts,<br />

we may conclude that the random hinge method provides a faithful description of the<br />

transport when the step length s is much shorter than the first transport mean free path<br />

λ el,1 , so that the global angular deflection and lateral displacement are small. Surprisingly,<br />

it does work well also in condensed (class I) simulations, where this requirement<br />

is not met. In spite of its simplicity, the random hinge method competes in accuracy<br />

and speed with other, much more sophisticated transport algorithms (see Bielajew and<br />

Salvat, 2001, and references therein). It seems that the randomness of the hinge position<br />

τ leads to correlations between the angular deflection and the displacement that<br />

are close to the actual correlations.<br />

1<br />

2<br />

➤<br />

r<br />

➤<br />

^<br />

r+τ d<br />

χ<br />

^<br />

r+s d<br />

➤<br />

t<br />

➤<br />

Figure 4.2: Simulation of a track near the crossing of an interface.<br />

The random hinge algorithm can be readily adapted to simulate multiple elastic<br />

scattering processes in limited material structures, which may consist of several regions<br />

of different compositions separated by well-defined surfaces (interfaces). In these geometries,<br />

when the track crosses an interface, we simply stop it at the crossing point,<br />

and resume the simulation in the new material. In spite of its simplicity, this recipe<br />

gives a fairly accurate description of interface crossing. To see this, consider that a hard<br />

collision has occurred at the position r in region “1” and assume that the following hard<br />

collision occurs in region “2”. The step length s between these two hard collisions is<br />

larger than the distance t from r to the interface (see fig. 4.2). If the artificial soft elastic<br />

collision occurs in region “1”, the angular deflection in this collision is sampled from the<br />

distribution F (s) (s; χ). Otherwise, the electron reaches the interface without changing<br />

its direction of movement. Assuming s ≪ λ (s)<br />

el,1 , the mean angular deflection due to soft<br />

collisions is<br />

1 − 〈cos χ〉 (s) = 1 − exp(−s/λ (s)<br />

el,1 ) ≃<br />

s<br />

λ (s)<br />

el,1<br />

. (4.22)<br />

Moreover, when this assumption is valid, lateral displacements due to soft collisions are<br />

small and can be neglected to a first approximation. As the probability for the soft<br />

collision to occur within region “1” equals t/s, the average angular deflection of the

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