LTQ Orbitrap XL Hardware Manual

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Functional Description Orbitrap Analyzer Figure 1-13. Approximate shape of ion packets of different m/q after stabilization of voltages As mentioned above, stable ion trajectories within the Orbitrap combine axial oscillations along the z-axis with rotation around the central electrode and vibrations in the radial direction. (See Figure 1-10 on page 1-13.) For any given m/q, only the frequency of axial oscillations is completely independent of initial ion parameters, while rotational and radial frequencies exhibit strong dependence on initial radius and energy. Therefore, ions of the same mass/charge ratio continue to oscillate along z together, remaining in-phase for many thousands of oscillations. In contrast to the axial oscillations, the frequencies of radial and rotational motion will vary for ions with slightly different initial parameters. This means that in the radial direction, ions dephase orders of magnitude faster than in the axial direction, and the process occurs in a period of only 50–100 oscillations. After this, the ion packet of a given m/q assumes the shape of a thin ring, with ions uniformly distributed along its circumference. (See Figure 1-13.) Because of this angular and radial smearing, radial and rotational frequencies cannot appear in the measured spectrum. Meanwhile, axial oscillations will persist, with axial thickness of the ion ring remaining small compared with the axial amplitude. Moving from one half outer electrode to the other, this ring will induce opposite currents on these halves, thus creating a signal to be detected by differential amplification. 1-16 LTQ Orbitrap XL Hardware Manual Thermo Fisher Scientific
Active Temperature Control Peltier Cooling Functional Description Orbitrap Analyzer Active temperature control is achieved by monitoring temperature directly on the Orbitrap assembly and compensating any changes in ambient temperature by a thermoelectric cooler (Peltier element) on the outside of the UHV chamber. A dedicated temperature controller board is used for this purpose. See page 1-48. To allow stable operating conditions in the UHV chamber, it can be cooled or heated (outgassing) by means of a Peltier element located on the outside. A second Peltier element is located on the back of the CE power supply board. See Figure 1-32 on page 1-45. The Peltier cooling is based on the Peltier Effect, which describes the effect by which the passage of an electric current through a junction of two dissimilar materials (thermoelectric materials) causes temperature differential (cooling effect). The voltage drives the heat to flow from one side of the Peltier element to the other side, resulting in cooling effects on one side and heating effects on the other side. To remove the heat from the hot side of the Peltier elements, they are connected to the cooling water circuit of the LTQ Orbitrap XL. See topic “Cooling Water Circuit” on page 1-28 for further information. Thermo Fisher Scientific LTQ Orbitrap XL Hardware Manual 1-17
Page 1 and 2: For Research Use Only Not for use i
Page 3: Place Declaration of Conformity her
Page 6 and 7: Conformité DEEE Ce produit doit ê
Page 8 and 9: Read This First Related Documentati
Page 10 and 11: Read This First Typographical Conve
Page 12 and 13: Read This First Safety and EMC Info
Page 14 and 15: Read This First Safety and EMC Info
Page 17 and 18: Contents Chapter 1 Functional Descr
Page 19 and 20: Figures LTQ Orbitrap XL front view
Page 21: Tables System status LEDs of the Pr
Page 24 and 25: Functional Description General Desc
Page 26 and 27: Functional Description General Desc
Page 28 and 29: Functional Description Control Elem
Page 34 and 35: Functional Description Linear Ion T
Page 36 and 37: Functional Description Orbitrap Ana
Page 40 and 41: Functional Description Orbitrap Ana
Page 42 and 43: Functional Description Vacuum Syste
Page 48 and 49: Functional Description Gas Supply I
Page 50 and 51: Functional Description Cooling Wate
Page 52 and 53: Functional Description Printed Circ
Page 79 and 80: Chapter 2 Basic System Operations M
Page 81 and 82: Basic System Operations Shutting Do
Page 83 and 84: Shutting Down the System Basic Syst
Page 85 and 86: Starting Up the System after a Shut
Page 87 and 88: Basic System Operations Starting Up
Page 89:
Basic System Operations Resetting t
Page 92 and 93:
User Maintenance General Remarks Ge
Page 94 and 95:
User Maintenance Baking Out the Sys
Page 96 and 97:
User Maintenance Maintaining the Va
Page 99 and 100:
Chapter 4 Replaceable Parts This ch
Page 101 and 102:
Parts Orbitrap Analyzer Parts Pumpi
Page 103 and 104:
Parts Gas and Water Supply Replacea
Page 105 and 106:
Electronic Parts Electronics - Righ
Page 107:
Electronics Main Supply Table 4-18.
Page 110 and 111:
Glossary: collision-induced dissoci
Page 112 and 113:
Glossary: IEEE IEEE Institute of El
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Glossary: P/N P/N part number p-p p
Page 116 and 117:
Glossary: V dc V dc volts direct cu
Page 118 and 119:
Index: D control unit, for turbopum
Page 120 and 121:
Index: O O pressure 1-26 pressure r
Page 122:
Index: W quality 1-40 safety thresh
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LTQ Orbitrap XL Hardware Manual

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