Data Sheet - Freescale Semiconductor

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MMA27XXW CASE 2086-01 ISSUE C 16 LEAD QFN Sensors 82 Freescale Semiconductor, Inc.
8 Revision History Table 69. Revision history Revision number Revision date 0 10/2012 • Initial release. 0.5 04/2013 Description of changes • Deleted “J” versions of devices and Silicon rev. column on ordering information table. Added Rail options to table. • Figure 3: Added C6 capacitor between BUSRTN and BUSOUT DC . • Table 2: Added additional information for description of C1. Added C6 capacitor description. Added additional information for description of C1. • Figure 5: Deleted (J) from the marking diagram. • Section 2.4: Electrical characteristics - Sensor and Signal Chain table: Deleted “trimmed with a...” sentence from lines 57-66. • Section 2.5: Electrical characteristics - Self-test and Overload table: Deleted lines 99 and 100 characteristics for “J” versions of device. • Section 2.6: Dynamic electrical characteristics - DSI3: Updated Typ values for lines 106, 111, 118, 120-126, 128, 130, 132-136, 140-142, 144, and 147-150. Updated Min and Max values for lines 139, 143, 145, 146, and 150. • Section 2.7: Dynamic electrical characteristics - signal chain: Added x-pole description to Cutoff frequency lines. Deleted lines for “Filter order LPFx” and “Filter order, startup Phase x”. Updated Typ values for lines 161, 163, 166, 168, and 178. • Section 2.7: Dynamic electrical characteristics - supply and support circuitry: Deleted line Oscillator cycles in training time row, Updated Min, Typ and Max values for lines 199-201 and Min values for lines 208 and 209. • Deleted Section 2.9. • Table 33: Updated Typical Block Latency column values. • Table 34: Updated Group Delay column values. • Replaced paragraph for Section 4.3. MMA27XXW Sensors Freescale Semiconductor, Inc. 83
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Freescale Semiconductor Document Nu
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1 Block Diagram, Pin Descriptions,
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1.3 Application diagram C2 C3 C4 Ta
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2 Electrical Characteristics 2.1 Ma
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2.4 Electrical Characteristics - se
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2.6 Dynamic electrical characterist
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2.8 Dynamic electrical characterist
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3.1.1 IC Type register The IC Type
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3.1.9 Device Serial Number register
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3.1.13.3 Clock Calibration Enable (
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3.1.15.4 Periodic Data Collection M
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3.1.19.2 Oscillator Training Error
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3.1.19.14 BUS IN Undervoltage Error
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3.1.22 DSI3 Communication CRC Polyn
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3.1.25.1 Low-pass filter selection
Page 31 and 32: 3.1.28 Reserved Registers A registe
Page 33 and 34: 3.3 Voltage regulators The device d
Page 35 and 36: BUS_I V BUF V REG V REGA I DATA POR
Page 37 and 38: 3.4 Internal oscillator The device
Page 39 and 40: 3.5.2 Self-test interface The self-
Page 41 and 42: 3.5.4.1 Decimation Sinc filter The
Page 43 and 44: Figure 17. Low-pass filter characte
Page 49 and 50: 3.5.4.4 Signal compensation The dev
Page 51 and 52: Figure 24. 10 Hz offset cancellatio
Page 53 and 54: Figure 26. 0.1 Hz offset cancellati
Page 55 and 56: 3.6 DSI3 physical layer 3.6.1 Comma
Page 57 and 58: 3.6.2 Response transmitter The resp
Page 59 and 60: 3.7.2 Synchronous Sampling mode wit
Page 61 and 62: 4 DSI3 Protocol The DSI3 standard d
Page 63 and 64: 4.2.1.1 Bit encoding Figure 41 show
Page 65 and 66: 4.2.2.1 Symbol Encoding The device
Page 67 and 68: 4.2.3 DSI3 Command and Response Mod
Page 69 and 70: 4.2.4.2 Register Write Command The
Page 71 and 72: 4.2.4.4 Enter Periodic Data Collect
Page 73 and 74: 4.3.2 DSI3 Periodic Data Collection
Page 75 and 76: 4.3.3 DSI3 Periodic Data Collection
Page 77 and 78: 4.4 Maximum number of devices on a
Page 79 and 80: 6 Recommended Footprint Reference F
Page 81: CASE 2086-01 ISSUE C 16 LEAD QFN MM
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Data Sheet - Freescale Semiconductor

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