18.02.2014 Views

RRFM 2009 Transactions - European Nuclear Society

RRFM 2009 Transactions - European Nuclear Society

RRFM 2009 Transactions - European Nuclear Society

SHOW MORE
SHOW LESS

Create successful ePaper yourself

Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.

(a)<br />

Weight fraction (%)<br />

100<br />

90<br />

80<br />

70<br />

60<br />

50<br />

40<br />

30<br />

20<br />

10<br />

U 3 Si 5 pure phase, probably due to some Al substitution) is found in coexistence with an<br />

highly Si enriched U(Al,Si) 3 phase (according to its cell parameter [13]). The thin intermediate<br />

layer shown by SEM+EDS examinations is not clearly evidenced by µ-XRD measurements,<br />

perhaps because it just corresponds to a transition zone, with no specific "signature" in terms<br />

of phases. Close to the Al side, as in type 1 ILs, U(Al,Si) 3 + UMo 2 Al 20 phases are present, the<br />

Si enrichment of the U(Al,Si) 3 phase being greater than that found in type 1 ILs. Some α-U is<br />

also evidenced in U-Mo : its presence was not systematically noticed and could be linked to<br />

a local destabilisation of γU-Mo.<br />

(b)<br />

Al U-Mo Al +Si<br />

Al + Si<br />

UAl3<br />

U(Al,Si)3<br />

Al<br />

UMo2Al20<br />

U6Mo4Al43<br />

UMo7<br />

UC<br />

0<br />

0 100 200 300 400 500 600<br />

Vertical position (µm)<br />

Figure 5 : µ-XRD analysis of an U-Mo7/Al-Si2 diffusion couple.<br />

(a) Major phases distribution throughout the IL, (b) simplified summary of the results<br />

Al<br />

U(Al,Si) 3 (a moy = 4.23 Å 17 at% Si)<br />

+ UMo 2 Al 20<br />

UAl 3 (a moy = 4.27 Å)<br />

+ U 6 Mo 4 Al 43<br />

γU-Mo7 + traces (UC…)<br />

(a)<br />

Weight fraction (%)<br />

100<br />

90<br />

80<br />

70<br />

60<br />

50<br />

40<br />

30<br />

Al<br />

U(Al,Si)3<br />

Al<br />

UMo2Al20<br />

U3Si5<br />

UMo7<br />

UC<br />

Ualpha<br />

U-Mo<br />

(b)<br />

Al + Si<br />

Al<br />

U(Al,Si) 3 (a moy = 4.16 Å 43 at% Si)<br />

+ UMo 2 Al 20<br />

U(Al,Si) 3 (a moy = 4.17 Å 39 at% Si)<br />

+ U 3 (Si,Al) 5<br />

20<br />

10<br />

γU-Mo7 + traces (UC…)<br />

0<br />

0 50 100 150 200<br />

Vertical position (µm)<br />

Figure 6 : µ-XRD analysis of an U-Mo7/Al-Si7 diffusion couple.<br />

(a) Major phases distribution throughout the IL, (b) simplified summary of the results<br />

In U-Mo7/Al-Si5 couples, type 2 areas, with thinner U(Al,Si) 3 + U 3 (Si,Al) 5 sub-layers, were<br />

also characterized by µ-XRD. No destabilisation of γU-Mo was evidenced beneath these<br />

areas, contrary to that observed in U-Mo, by Komar et al, beneath locally thicker IL areas, in<br />

U-Mo7/Al 6061 diffusion couples [14].<br />

By comparing the results obtained on diffusion couples annealed at 450°C with those<br />

concerning couples which underwent a complementary long annealing at 350°C, we have<br />

checked that no significant evolution occurred in both types of ILs, apart an increase of the<br />

grain size of the phases, despite of a massive destabilisation of the underlying γU-Mo7 alloy<br />

(as expected, by reference to TTT curves [15]).<br />

153 of 455

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!