Local polarization dynamics in ferroelectric materials
Local polarization dynamics in ferroelectric materials
Local polarization dynamics in ferroelectric materials
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Rep. Prog. Phys. 73 (2010) 056502<br />
Figure 30. (a) Antipol<strong>in</strong>g effect observed on epitaxial PZT. (b)<br />
Schematic representation of the effect: (left) pol<strong>in</strong>g at high voltage<br />
and (right) collection of surface charges and formation of opposite<br />
field, lead<strong>in</strong>g to <strong>polarization</strong> switch<strong>in</strong>g. The doma<strong>in</strong> wall between<br />
the upper and lower regions reduces the electrostatic energy of the<br />
head-to-head configuration. In the center schematic the contribut<strong>in</strong>g<br />
potentials from the spherical model are presented. (c) Illustrates the<br />
surface charge distribution at the beg<strong>in</strong>n<strong>in</strong>g and at the end of a<br />
bias<strong>in</strong>g experiment, and after the bias is turned off. (a), (b)<br />
Reproduced with permission from [304], copyright 2005, American<br />
Physical Society.<br />
known by now [305–307]. While the electrochemistry<br />
of classical <strong>ferroelectric</strong>s such as PZT and BTO <strong>in</strong><br />
ultrath<strong>in</strong> films and <strong>in</strong> the presence of water vapor is not<br />
studied, experimental observations suggest that tip-<strong>in</strong>duced<br />
electrochemical processes are extremely common. Typically,<br />
their onset is associated with the formation of ‘switched’<br />
patterns with low contrast and highly disordered and broad<br />
doma<strong>in</strong>s walls. Often the process is associated with the<br />
formation of topographic features follow<strong>in</strong>g the bias pattern.<br />
For high biases and humidities, the complete breakdown of the<br />
film and the formation of particulates are observed. Recent<br />
measurements suggest that the onset of the electrochemical<br />
processes is related to the leakage current flow. Note that<br />
these processes are closely related to the transport properties<br />
of <strong>ferroelectric</strong>s, actively studied <strong>in</strong> the context of resistive<br />
switch<strong>in</strong>g [42, 267, 268, 308], and hence must be considered<br />
<strong>in</strong> this context.<br />
3.3. Theory of tip-<strong>in</strong>duced <strong>polarization</strong> switch<strong>in</strong>g<br />
The analysis of the tip-<strong>in</strong>duced switch<strong>in</strong>g behavior by<br />
PFM necessitates the comparison between macroscopic and<br />
microscopic switch<strong>in</strong>g as a first step of theoretical analysis.<br />
The sem<strong>in</strong>al work by Landauer has demonstrated that<br />
the experimentally observed switch<strong>in</strong>g fields correspond to<br />
S V Kal<strong>in</strong><strong>in</strong> et al<br />
impossibly large (∼10 3 –10 5 kT) values for the nucleation<br />
activation energy [79]. This discrepancy is resolved by<br />
postulat<strong>in</strong>g the presence of discrete switch<strong>in</strong>g centers <strong>in</strong>itiat<strong>in</strong>g<br />
low-field nucleation. The spatial and energy distribution of<br />
the nucleation center has become the central component of all<br />
statistical theories for <strong>polarization</strong> switch<strong>in</strong>g <strong>in</strong> macroscopic<br />
<strong>ferroelectric</strong>s [66, 95]. Notably, this behavior is universal<br />
to all first order phase transitions <strong>in</strong>clud<strong>in</strong>g solidification,<br />
martensitic transformations and phenomena such as plastic<br />
deformation and electrochemical reactions, <strong>in</strong> which the<br />
formation of a new phase is always <strong>in</strong>itiated at a specific<br />
defect site or is controlled by defect <strong>dynamics</strong>. Given that<br />
typical spac<strong>in</strong>gs between extended defects are on the order<br />
of 10–100 nm, even high-quality epitaxial films will have<br />
multiple defects with<strong>in</strong> a typical device structure such as a<br />
micrometer-sized capacitor.<br />
In comparison, <strong>in</strong> an SPM experiment, the field is<br />
concentrated to a small (10–30 nm) volume with<strong>in</strong> a material<br />
that may possess small number of defects or be (extended)<br />
defect free. This opens the pathway for prob<strong>in</strong>g defectmediated<br />
switch<strong>in</strong>g <strong>in</strong> <strong>ferroelectric</strong>s on a s<strong>in</strong>gle defect<br />
level. The orig<strong>in</strong>al work by Landauer [79] utilized the<br />
rigid <strong>ferroelectric</strong> approximation (<strong>polarization</strong> is P or −P ,<br />
doma<strong>in</strong> walls are <strong>in</strong>f<strong>in</strong>itely th<strong>in</strong>) to describe thermo<strong>dynamics</strong><br />
of doma<strong>in</strong> formation <strong>in</strong> a uniform field. This approach was<br />
extended <strong>in</strong> a series of groundbreak<strong>in</strong>g works by Molotskii<br />
et al [309–313] to the analysis of the doma<strong>in</strong> formation<br />
<strong>in</strong>duced by the <strong>in</strong>homogeneous electric field of a biased SPM<br />
probe. This thermodynamic analysis was further developed<br />
by Morozovska et al to account for the f<strong>in</strong>ite electric field<br />
below the probe, surface and bulk screen<strong>in</strong>g and presence of<br />
defects [211, 314]. Below, we develop a general description<br />
of switch<strong>in</strong>g thermo<strong>dynamics</strong> <strong>in</strong> the rigid approximation.<br />
3.3.1. General formalism of the problem. The free energy of<br />
a nucleat<strong>in</strong>g <strong>ferroelectric</strong> doma<strong>in</strong> is [314]<br />
(r,U) = d (r) + Dom (r,U) ,<br />
(3.1a)<br />
where the doma<strong>in</strong> geometry is described by the N-dimensional<br />
parameter vector, r (which can be, e.g., coord<strong>in</strong>ates of all<br />
po<strong>in</strong>ts on a doma<strong>in</strong> wall, or the radius and length <strong>in</strong> the semiellipsoidal<br />
approximation) and U is the electric bias applied to<br />
the local probe <strong>in</strong> the proximity of the surface. The first term<br />
<strong>in</strong> equation (3.1a) is the contribution from the frozen disorder<br />
(i.e. random electric fields <strong>in</strong> the material), d (r), with<strong>in</strong> the<br />
volume of the doma<strong>in</strong>. The second term <strong>in</strong> equation (3.1a) is<br />
the thermodynamic work of switch<strong>in</strong>g<br />
Dom (r,U) = S (r) + p (r,U) + D (r) .<br />
(3.1b)<br />
It comprises the contributions of positive doma<strong>in</strong> wall energy,<br />
S (r) = ψ S S, where S is the doma<strong>in</strong> surface and ψ S is the<br />
doma<strong>in</strong> wall energy density, p (r,U) is the energy density<br />
due to the probe field and D (r) is the de<strong>polarization</strong> energy.<br />
The analysis of the switch<strong>in</strong>g process can be simplified<br />
for a rigid piezoelectric, for which effective material constants<br />
are <strong>in</strong>dependent of the electric field. In this case, the<br />
<strong>in</strong>teraction energy with the probe tip electric field, E p 3 (x),<br />
30