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Local polarization dynamics in ferroelectric materials

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Rep. Prog. Phys. 73 (2010) 056502<br />

S V Kal<strong>in</strong><strong>in</strong> et al<br />

I<br />

V (air)<br />

I. No switch<strong>in</strong>g<br />

II. Partial III. Uniform<br />

(a)<br />

1 µm<br />

IV (isopropanol)<br />

(b)<br />

400 nm<br />

III (isopropanol)<br />

Field localization<br />

non-local non-local<br />

IV. Fractal<br />

V. <strong>Local</strong><br />

3 µm<br />

2 µm<br />

(e)<br />

Pulse bias and length<br />

Figure 61. (a)–(d) PFM phase images illustrat<strong>in</strong>g doma<strong>in</strong> morphology <strong>in</strong> regions I–V and the choice of solvent for the phase map<br />

<strong>in</strong> (e). (e) Schematic parameter diagram of possible switch<strong>in</strong>g modes versus field localization and pulse parameters. Reproduced<br />

from [413]. Copyright 2007, American Physical Society.<br />

Figure 62. Fabrication steps for <strong>in</strong>sulated PFM probe for imag<strong>in</strong>g <strong>in</strong> liquid environment. Reproduced from [414]. Copyright 2007,<br />

American Institute of Physics.<br />

switched regions [269] and may be of concern to bismuth<br />

ferrite capacitor based applications.<br />

7. Summary<br />

Strong coupl<strong>in</strong>g between order parameters and electromechanical<br />

response <strong>in</strong> <strong>ferroelectric</strong> <strong>materials</strong> enables a local probe<br />

approach for study<strong>in</strong>g the static doma<strong>in</strong> structures and <strong>polarization</strong><br />

<strong>dynamics</strong>. The unique image formation mechanism of<br />

PFM and its spectroscopic and dynamic modes have rendered<br />

them a quantitative and powerful method for prob<strong>in</strong>g <strong>ferroelectric</strong>s<br />

on the nanometer level, and have opened new venues<br />

<strong>in</strong> understand<strong>in</strong>g the role of defects on switch<strong>in</strong>g, <strong>polarization</strong><br />

order<strong>in</strong>g <strong>in</strong> relaxors and many other applications. The future<br />

will undoubtedly see atomic level studies on an eng<strong>in</strong>eered<br />

defect structure (<strong>in</strong>clud<strong>in</strong>g imag<strong>in</strong>g <strong>in</strong> vacuum and <strong>in</strong> liquid),<br />

perhaps on a s<strong>in</strong>gle unit cell level. A new generation of dynamic<br />

PFM modes is emerg<strong>in</strong>g to allow high energy resolution<br />

spectroscopy and of weakly piezoelectric <strong>materials</strong>. The comb<strong>in</strong>ation<br />

of PFM and EM methods offers the opportunity for<br />

imag<strong>in</strong>g atomic rearrangements dur<strong>in</strong>g <strong>polarization</strong> switch<strong>in</strong>g<br />

<strong>in</strong> situ. These developments will lead to new advancements <strong>in</strong><br />

areas such as <strong>in</strong>formation technologies, data storage, energy<br />

technologies, electrophysiology, as well as new serendipitous<br />

areas we can only imag<strong>in</strong>e.<br />

Acknowledgments<br />

This work was sponsored by the Center for Nanophase<br />

Materials Sciences, Oak Ridge National Laboratory, managed<br />

and operated by UT-Battelle, LLC for the Office of Basic<br />

Energy Sciences, US Department of Energy (SVK, BJR)<br />

and by the DOE under the grant number DOE DE-FG02-<br />

07ER46417 (LQC). BJR also acknowledges the support of<br />

UCD Research. The authors are grateful to E A Eliseev and<br />

S Choudhury for their contributions to this work and to the<br />

numerous authors who provided permission to reproduce their<br />

work here. SVK gratefully acknowledges the collaboration<br />

with Stephen Jesse, N<strong>in</strong>a Balke, Maxim Nikiforov, Katyayani<br />

Seal, Peter Maksymovych and Alexander Tselev, as well as<br />

Roger Proksch (Asylum Research). He is also grateful to<br />

numerous CNMS users and attendees of the PFM workshop<br />

series, discussions with whom have contributed immensely to<br />

the writ<strong>in</strong>g of this paper.<br />

References<br />

[1] von Hippel A, Breckenridge R G, Chesley F G and Tisza L<br />

1946 J. Ind. Eng. Chem. 38 1097<br />

[2] Wul B M 1946 J. Phys. USSR 10 95<br />

Wul B M 1946 Nature 157 808<br />

61

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