MEMORY DATABOOK - Al Kossow's Bitsavers

• RELIABILITY INFORMATION •• ------------------~OKI MEMORY LSI LIFE TEST RESULTSDevice name MSM41256-XXRS MSM3764A-XXRS MSM5165-XXRSFunction262144 x 1 bit 65536 x 1 bit 8192 x 8 bitDYNAMIC RAM DYNAMIC RAM STATIC RAMoTestitemStructureTest conditionTa = 125°COperating Vcc = 5.5Vlife test Ta = 150 0 VVcc = 5.5V140°C 85%Temperature Vcc = 5.5Vhumidity test 85°C 85%Vcc = 5.5VPressure 121°C 100%cooker test No biasLow tempera- Ta = _10°Cture life test Vcc = 7.0VSi gate N-MOS Si gate N-MOS Si gate C-MOS16P plastic package 16P plastic package 28P plastic packageSample TestFailures Sample Test Failures Sample Test Failuressize hours Size hours size hours300 2000 0 300 2000 0 88 2000 040 6000 0 50 2000 0 50 2000 0100 100 0 100 100 0 22 100 0100 2000 0 150 2000 0 100 2000 0100 500 0 100 500 0 50 300 022 2000 0 22 2000 0 22 2000 0Temperature _55°C -5005005001000 1000 100cycling test 150°C cycles cycles cycles0Device name MSM27256-AS MSM38256-XXRS MSM531000-XXRSTest itemFunctionStructureTest condition32768 x 8 bit 32768 x 8 bit MSM531000-XXRSUV erasable EP ROM Mask ROM Mask ROMSi gate N-MOS Si gate N-MOS Si gate C-MOS28P cerdip 28P plastic package 28P plastic packageSample TestFailures Sample Test Failures Sample Test Failuressize hours Size hours size hoursTa = 125°COperating Vcc = 5.5Vlife test Ta = 150°CVcc = 5.5V140°C 85%Temperature Vcc = 5.5Vhumidity test 85°C 85%Vcc = 5.5VPressure 121°C 100%cooker test No biasLow tempera- Ta = _10°Ctu re I ife test Vcc = 7.0V88 2000 0 55 2000 0 88 2000 040 2000 022 100 050 1000 0 50 2000 0 25 2000 022 48 0 22 500 0 50 200 022 2000 0 22 2000 0Temperature _55°C -5003001000 50cycling test 150°C cycles cycles0 50 300 028