PCT/2001/45 - World Intellectual Property Organization

45/2001
8 Nov/nov 2001 PCT Gazette - Section I - Gazette du PCT 20249
(71) SEIKO EPSON CORPORATION [JP/JP];
4-1, Nishi-Shinjuku 2-Chome, Shinjuku-Ku,
Tokyo 163-0811 (JP).
(72) GOTO, Noboru; c/o TOHOKU EP-
SON CORPORATION, 166-3, Jurizuka,
Sakata-shi, Yamagata 998-0194 (JP). SAITO,
Mikio; c/o TOHOKU EPSON CORPORA-
TION, 166-3, Jurizuka, Sakata-shi, Yamagata
998-0194 (JP).
(74) KAMIYANAGI, Masataka et al. / etc.; c/o
Intellectual Property Division, SEIKO EP-
SON CORPORATION, 3-5, Owa 3-Chome,
Suwa-Shi, Nagano 392-8502 (JP).
(81) CN JP.
(84) EP (AT BE CH CY DE DK ES FI FR GB GR
IE IT LU MC NL PT SE TR).
(51) 7 G01N 23/00
(11) WO 01/84129 (13) A2
(21) PCT/EP01/04507
(22) 20 Apr/avr 2001 (20.04.2001)
(25) en (26) en
(30) 09/561,508 27 Apr/avr 2000 US
(27.04.2000)
(43) 8 Nov/nov 2001 (08.11.2001)
(54) METHOD AND DEVICE USING
X-RAYS TO MEASURE THICKNESS
AND COMPOSITION OF THIN FILMS
APPAREIL ET PROCEDE EMPLOYANT
DES RAYONS X EN VUE DE MESU-
RER L’EPAISSEUR ET LA COMPOSI-
TION DE FILMS FINS
(71) KONINKLIJKE PHILIPS ELECTRON-
ICS N.V. [NL/NL]; Groenewoudseweg 1,
NL-5621 BA Eindhoven (NL).
(72) NELSON, Keith, A.; Prof. Holstlaan 6,
NL-5656 AA Eindhoven (NL).
(74) BAKKER, Hendrik; Internationaal Octrooibureau
B.V., Prof. Holstlaan 6, NL-5656
AA Eindhoven (NL).
(81) JP.
(84) EP (AT BE CH CY DE DK ES FI FR GB GR
IE IT LU MC NL PT SE TR).
(51) 7 G01N 23/00
(11) WO 01/84130 (13) A2
(21) PCT/IL01/00385
(22) 30 Apr/avr 2001 (30.04.2001)
(25) en (26) en
(30) 09/561,958 1 May/mai 2000 US
(01.05.2000)
(43) 8 Nov/nov 2001 (08.11.2001)
(54) A NANOTUBE-BASED ELECTRON
EMISSION DEVICE AND SYSTEMS
USING THE SAME
DISPOSITIF D’EMISSION ELECTRO-
NIQUE A NANOTUBE ET SYSTEMES
UTILISANT CE DISPOSITIF
(71) EL-MUL TECHNOLOGIES LTD.
[IL/IL]; P.O.Box 571, Soreq, 81104 Yavne
(IL).
(for all designated States except / pour tous
les États désignés sauf US)
(72, 75) EITAN, Guy [IL/IL]; Ehud Street 48,
73134 Menorah (IL). ZIK, Ory [IL/IL];
Heikel Hatalmud 3, 65136 Tel Aviv (IL).
ROSENBLATT, David [US/US]; 225
Church St. No 7C, Philadelphia, PA 19106
(US).
(74) REINHOLD COHN AND PARTNERS;
P.O.B. 4060, 61040 Tel Aviv (IL).
(81) AE AG AL AM AT AU AZ BA BB BG BR
BY BZ CA CH CN CO CR CU CZ DE DK
DM DZ EE ES FI GB GD GE GH GM HR
HU ID IL IN IS JP KE KG KP KR KZ LC
LK LR LS LT LU LV MA MD MG MK MN
MW MX MZ NO NZ PL PT RO RU SD SE
SG SI SK SL TJ TM TR TT TZ UA UG US
UZ VN YU ZA ZW.
(84) AP (GH GM KE LS MW MZ SD SL SZ TZ
UG ZW); EA (AM AZ BY KG KZ MD RU
TJ TM); EP (AT BE CH CY DE DK ES FI
FR GB GR IE IT LU MC NL PT SE TR); OA
(BF BJ CF CG CI CM GA GN GW ML MR
NE SN TD TG).
(51) 7 G01N 23/04
(11) WO 01/84131 (13) A1
(21) PCT/US01/14176
(22) 2 May/mai 2001 (02.05.2001)
(25) en (26) en
(30) 60/201,324 2 May/mai 2000 US
(02.05.2000)
(43) 8 Nov/nov 2001 (08.11.2001)
(54) SYSTEMS FOR DETECTING AND
COMPENSATING FOR IMAGE ARTI-
FACTS WHILE SCANNING AN IMAG-
ING PLATE
SYSTEMES DE DETECTION ET DE
COMPENSATION D’ARTEFACTS
IMAGES LORS DU BALAYAGE D’UNE
PLAQUE D’IMAGERIE
(71) PHORMAX CORPORATION [US/US];
750 N. Mary Street, Sunnyvale, CA
94085-2928 (US).
(72) NISHIHARA, H., Keith; 1468 Richardson
Avenue, Los Altos, CA 95014 (US). WIL-
FLEY, Brian, P.; 1675 Juarez Avenue, Los
Altos, CA 94024 (US).
(74) HECKADON, David, R. et al. / etc.;
Townsend and Townsend and Crew LLP, 2
Embarcadero Center, 8th floor, San Francisco,
CA 94111 (US).
(81) AE AG AL AM AT AU AZ BA BB BG BR
BY BZ CA CH CN CO CR CU CZ DE DK
DM DZ EE ES FI GB GD GE GH GM HR
HU ID IL IN IS JP KE KG KP KR KZ LC
LK LR LS LT LU LV MA MD MG MK MN
MW MX MZ NO NZ PL PT RO RU SD SE
SG SI SK SL TJ TM TR TT TZ UA UG UZ
VN YU ZA ZW.
(84) AP (GH GM KE LS MW MZ SD SL SZ TZ
UG ZW); EA (AM AZ BY KG KZ MD RU
TJ TM); EP (AT BE CH CY DE DK ES FI
FR GB GR IE IT LU MC NL PT SE TR); OA
(BF BJ CF CG CI CM GA GN GW ML MR
NE SN TD TG).
(51) 7 G01N 27/12
(11) WO 01/84132 (13) A2
(21) PCT/DE01/01485
(22) 17 Apr/avr 2001 (17.04.2001)
(25) de (26) de
(30) 100 20 768.5 28 Apr/avr 2000
(28.04.2000)
(43) 8 Nov/nov 2001 (08.11.2001)
DE
(54) CALIBRATION AND INCREASING OF
THE SELECTIVITY OF CHEMOSEN-
SORS
ETALONNAGE ET AUGMENTATION
DE LA SELECTIVITE DE CAPTEURS
DE PRODUITS CHIMIQUES
(71, 72) MIRSKY, Vladimir [DE/DE]; Wieshuberstrasse
3, 93059 Regensburg (DE).
(81) CA JP US.
(84) EP (AT BE CH CY DE DK ES FI FR GB GR
IE IT LU MC NL PT SE TR).
(51) 7 G01N 27/327, C12Q 1/00
(11) WO 01/84133 (13) A1
(21) PCT/JP01/03685
(22) 27 Apr/avr 2001 (27.04.2001)
(25) ja (26) ja
(30) 2000-127469 27 Apr/avr 2000 JP
(27.04.2000)
(43) 8 Nov/nov 2001 (08.11.2001)
(54) BIOSENSOR
BIOCAPTEUR
(71) MATSUSHITA ELECTRIC INDUS-
TRIAL CO., LTD. [JP/JP]; 1006, Oaza
Kadoma, Kadoma-shi, Osaka 571-8501 (JP).
(for all designated States except / pour tous
les États désignés sauf US)
(72, 75) MIYAZAKI, Shoji [JP/JP]; 1052,
Minamisaya-cho, Matsuyama-shi, Ehime
791-8032 (JP). TOKUNAGA, Hiroyuki
[JP/JP]; 1348-6, Tanokubo, Shigenobu-cho,
Onsen-gun, Ehime 791-0212 (JP). FUJI-
WARA, Masaki [JP/JP]; 1112-1, Kumekubota-cho,
Matsuyama-shi, Ehime 791-1101
(JP). YAMANISHI, Eriko [JP/JP]; 3203-5,
Kitakatatanaka, Kawauchi-cho, Onsen-gun,
Ehime 791-0303 (JP).
(74) HAYASE, Kenichi; Hayase & Co. Patent
Attorneys, 8F, Easaka ANA Building, 17-1,
Enoki-cho, Suita-shi, Osaka 564-0053 (JP).
(81) CN US.
(84) EP (AT BE CH CY DE DK ES FI FR GB GR
IE IT LU MC NL PT SE TR).
(51) 7 G01N 27/447
(11) WO 01/84134 (13) A1
(21) PCT/JP00/02373
(22) 12 Apr/avr 2000 (12.04.2000)
(25) ja (26) ja
(43) 8 Nov/nov 2001 (08.11.2001)
(54) CAPILLARY ARRAY UNIT AND
ELECTROPHORETIC DEVICE COM-
PRISING THE SAME
DISPOSITIF EN RANGEES DE CAPIL-
LAIRE ET UNITE D’ELECTROPHO-
RESE EQUIPEE DE CE DISPOSITIF
(71) HITACHI, LTD. [JP/JP]; 6, Kanda Surugadai
4-chome, Chiyoda-Ku, Tokyo 101-8010
(JP).
(for all designated States except / pour tous
les États désignés sauf US)
(72, 75) MORIOKA, Tomonari [JP/JP]; Instruments,
Hitachi, Ltd., 882, Ichige, Hitachinaka-shi,
Ibaraki 312-8504 (JP). SHIMIZU,
Yasushi [JP/JP]; Instruments, Hitachi,
Ltd., 882, Ichige, Hitachinaka-shi, Ibaraki
312-8504 (JP). UGAI, Seiichi [JP/JP];