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Technical Report - International Military Testing Association

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&ntroduction<br />

Reliability of Checking Computer<br />

Produced StatfstfcS<br />

CASMER ‘S. WINIEWICZ<br />

US Naval Examining Center<br />

With the advent of computer processing, it became porrible to reduce<br />

large amounts of raw data into more easily handled and more meaningful<br />

forms. Previously, where estimates of the statistical characteristics<br />

of examination6 , such as Iawshe’s D or Flanagan’s r based on eithtr upper<br />

and lover 25 or 27% of a sample wtrt used, it became possible to awitch<br />

to the original point-biserial correlation concept bartd cm the total<br />

samplt. Whtre computer configurations are extended to include a tape<br />

system, it becomes possible to expand the samplt to include the entire<br />

group of examineeo taking a particular examination.<br />

Computer processing, when applied to item analysir, results in<br />

dtcrtated processing time and earlier availability of results. Itan<br />

correlations and difficulty indices based on the total sample result6<br />

in more precise measurement, while the expansion of the sample size to<br />

include the entire population results in even greater stability of<br />

measurement.<br />

Howtver, computer procesring has not been an L;unixtd blessing. With<br />

the onset of any new system, new problems are generated. One of these<br />

problems concerns the introduction of discrepancies into item analyoir<br />

results.<br />

The carue of these discrepancies can be divided into three general<br />

. areas � The first arta could be labeled Program Error. Although new<br />

computer programs are &toted on actual samples of the data they will<br />

process, there is a limit to the exhaustiveness of these ttst8. In<br />

areas of measurement where samples vary in size and characteristics,<br />

unforseen program difficulties may arise.<br />

The stcond arta might be called Machine Error. All machines, even<br />

those components with few or no moving parts, are subject to failure<br />

when used over a period of time. In the read and punch components of<br />

the computtr configuration, burned out circuits may occur, causing a<br />

failure to read or punch out particular card columns. Such discrepancies<br />

are generally consistent in afftcting a particular part of the itan<br />

a.nalyais processed before the failure is discovered. Ir the computtr,<br />

components cooling fans my fall causing over-heating which reeults in<br />

the variable .loea of data. This type of error is the most difficult<br />

to spot by visual inspection because it is variable.<br />

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