FINAL SAMPLING AND ANALYSIS PLAN - Documents for Moffett Field
FINAL SAMPLING AND ANALYSIS PLAN - Documents for Moffett Field
FINAL SAMPLING AND ANALYSIS PLAN - Documents for Moffett Field
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• Matrix spike (MS) and matrix spike duplicate (MSD) recoveries and relative<br />
percent differences (RPDs)<br />
• Blank spike or laboratory control sample (LCS) recoveries<br />
• Method Blanks<br />
• Per<strong>for</strong>mance check<br />
• Initial calibration (ICAL) with retention time in<strong>for</strong>mation (When manual<br />
integration is per<strong>for</strong>med, raw data records shall include a complete audit trail <strong>for</strong><br />
those manipulations, raw data output showing the results of the manual integration,<br />
and notation of rationale, date and initials of person per<strong>for</strong>ming manual integration)<br />
• Continuing calibration (CCAL) with retention time in<strong>for</strong>mation<br />
• Internal standard areas and retention times<br />
• Analytical sequence<br />
Inorganic Analysis<br />
• Cover page (with laboratory name, address, phone number, contact person, and<br />
SDG number)<br />
• Case narrative<br />
• Copies of noncon<strong>for</strong>mance and corrective action <strong>for</strong>ms<br />
• COC <strong>for</strong>ms<br />
• Copies of sample receipts notices<br />
• Analytical results, including dilutions and re-analysis<br />
• Initial and continuing calibration verification (CCV)<br />
• Detection limit standard<br />
• Method blanks, CCAL blanks, and preparation blanks<br />
• Inductively coupled plasma (ICP) interference-check samples<br />
• MS and post-digestion spikes<br />
• Sample duplicates<br />
• LCSs<br />
• Method of standard additions<br />
• ICP serial dilution<br />
• Instrument detection limit<br />
Final Sampling and Analysis Plan<br />
Installation Restoration Site 29, Hangar 1<br />
Former Naval Air Station, <strong>Moffett</strong> <strong>Field</strong>, <strong>Moffett</strong> <strong>Field</strong>,<br />
Cali<strong>for</strong>nia<br />
DCN: AMEC-8816-0005-0039<br />
April 2010<br />
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