Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
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Accomplishments•Reliability Studies on WLBI die✔Life stress tests (op life, data retention bake(DRB), temperature cycle, etc …)✔Bump shear tests✔Under-fill adhesion tests<strong>BiTS</strong> 2001 <strong>Workshop</strong>T. McKenzie / W. Ballouli / J. Stroupe21
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