Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
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FormFactorMicrospr<strong>in</strong>g Contacts on SiliconRe-route TraceMicrospr<strong>in</strong>gSilicon•Microspr<strong>in</strong>gs provide:Temporary (pressure) connection dur<strong>in</strong>g test and <strong>Burn</strong>-<strong>in</strong>Permanent Interconnect <strong>in</strong> the f<strong>in</strong>al product•Microspr<strong>in</strong>gs can be located anywhere on the die surface <strong>in</strong>clud<strong>in</strong>gdirectly on the bond pads19