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Burn-in & Test Socket Workshop - BiTS Workshop

Burn-in & Test Socket Workshop - BiTS Workshop

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Process Improvement Work• Coefficient of Thermal Expansion Match<strong>in</strong>g• Uniform Thermal Control• Cluster Yield Improvement• Wafer Cold <strong>Test</strong><strong>BiTS</strong> 2001 <strong>Workshop</strong>T. McKenzie / W. Ballouli / J. Stroupe23

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