Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
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Aehr <strong>Test</strong> SystemsThe economics and time requirements of thealignment and burn-<strong>in</strong> processes dictate theWLBT System Architecture:! Wafer alignment is short duration but usesexpensive hardware! <strong>Burn</strong>-In process is time extensive! Cartridge based system separates the twoprocesses for best cost effectiveness<strong>Test</strong> Electronics and Software are critical toensure that effective contact is be<strong>in</strong>g made tothe devices:! Must test to ensure electrical connection! Additional time for test is <strong>in</strong>significantcompared to burn-<strong>in</strong> time! Functional test can be cost effective at thisstep of the process31