Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
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FormFactorFormFactor Inc. - Us<strong>in</strong>g Microspr<strong>in</strong>gContacts for Wafer-Level Packag<strong>in</strong>g & <strong>Test</strong>FormFactor has <strong>in</strong>vented a new contacttechnology called a MicroSpr<strong>in</strong>g suited forelectronic applications of a low force, low profile,z-axis, wip<strong>in</strong>g, gold on gold contact.! These are true spr<strong>in</strong>gs requir<strong>in</strong>g around onegram of compression force for every one mil ofdisplacement and exhibit low contact resistance,typically below 30 milliohm5 per contact pair.! They can be used as a f<strong>in</strong>e pitch contact downto pitches of 225 microns, ie., as <strong>in</strong> currentproduction of contact<strong>in</strong>g C4 (Flip chip) arrays of1000's of contacts.! They have been profiled as be<strong>in</strong>g ideally used <strong>in</strong>LGA production sockets and have been used <strong>in</strong>FormFactor’s own Probe Cards to test DRAMsor CPUs at the wafer level.17