Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
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Aehr <strong>Test</strong> SystemsAehr <strong>Test</strong> Systems - Wafer Level <strong>Burn</strong>-Inand <strong>Test</strong> SystemRecently Aehr <strong>Test</strong> Systems announceddevelopment agreements with NHK Spr<strong>in</strong>gCo., Ltd. of Yokohama, Japan for Full-Waferprobe contactors for WLBI and Electroglas,Inc. for a complete Wafer-Level <strong>Burn</strong>-<strong>in</strong> and<strong>Test</strong> solution. Aehr <strong>Test</strong> has been work<strong>in</strong>g <strong>in</strong>this area for several years with cofund<strong>in</strong>g fromDARPA. This section will describe therequirements for a comprehensive WLBTsystem and the solutions Aehr <strong>Test</strong> Systemshas developed.29
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