Burn-in & Test Socket Workshop - BiTS Workshop

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GryphicsThe suggested interface below consists of acontrolled compliance Module having asuspended contact set to interface with abumped device by means of several contactmembers. The module is to act as theinterface to the device, which can be dematedfrom the substrate without solder reflow andsubsequently moved to another location suchas a tester or additional circuit board:25
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Burn-in & TestSocket WorkshopIEEEMa
Page 3: Technical ProgramSession 8Wednesday
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Page 8 and 9: Purpose For DevelopingWafer Level B
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Page 28 and 29: AcknowledgmentsThe authors would li
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Page 32: Wafer-Level Test & Burn-InWafer-lev
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Burn-in & Test Socket Workshop - BiTS Workshop

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